Atomic Force Microscopes News

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NASA Uses Atomic Force Microscope to Produce First Ever Image of a Single Grain of Martian Dust

NASA's Phoenix Mars Lander has taken the first-ever image of a single particle of Mars' ubiquitous dust, using its atomic force microscope

15 Aug 2008

Speculation That The First Atomic Force Microscope on Mars Has Found Evidence of Life on Mars

Overnight the internet has been awash with speculation that the instruments, including the Atomic Force Microscope from Nanosurf, held in the MECA suite on the Phoenix Mars Lander has found life on Mars

5 Aug 2008

BudgetSensors Introduce AFM Probes with 4 Different Cantilevers on a Single Holder Chip

BudgetSensors, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories for Atomic Force Microscopes (AFM), announces the commercial introduction of the “All-In-One AFM Probe&rdquo...

29 Jul 2008

Virtual Environment Enables Scientists to Interpret Data from Dynamic AFMs

Purdue University is operating a virtual environment that enables scientists and engineers to interpret raw data collected with powerful instruments called dynamic atomic force microscopes.

17 Jul 2008

Nanosurf Atomic Force Microscope Has Been Used on Mars by Phoenix Mars Lander

NASA's Phoenix Mars Lander has finally used the onboard atomic force microscope from Nanosurf. We show the first AFM image from Mars

11 Jul 2008

New Grant Program to Promote the Use of AFMs

Veeco Instruments, a leading provider of instrumentation to the nanoscience community, today introduced the Veeco Labs Research Grant Program, designed to stimulate the generation of new scientific investigation for researchers in the atomic force microscopy community.

2 Jul 2008

Global Demand has Resulted in Atomic Force Microscope Manufacturer Nanosurf Opening a US Subsidiary

Lukas Howald, chairman of the board of directors and co-founder of Nanosurf, officially announced the opening of a Nanosurf subsidiary in the US during his talk on the company’s contribution to the NASA Phoenix Mars Mission at the SwissPavillion at the NSTI Nanotech 2008 nanotechnology conference and trade show.

10 Jun 2008

Veeco Introduce Powerful New Technique for Imaging with Atomic Force Microscopes

Veeco introduced HarmoniXTM, a powerful new atomic force microscope technique for high-resolution nanoscale imaging and analysis.
Veeco's HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps.

2 Jun 2008

Atomic Force Microscope from Nanosurf Lands Successfully on Mars

Nanosurf AG is proud to contribute the first space-adapted atomic force microscope (AFM) for NASA's current Mars Mission named Phoenix. The goal of the Phoenix Mission is to answer important questions such as whether water exists in forms that support life

28 May 2008

New Calibration Standards for AFM Height Introduced by BudgetSensors

As a response to the increased demand for affordable high-quality AFM calibration standards, BudgetSensors®, a Bulgarian manufacturer of silicon and silicon nitride probes, as well as AFM accessories for Atomic Force Microscopes (AFM), announces the commercial introduction of 2 different AFM height calibration standards - the HS-100MG and the HS-20MG

27 May 2008

Atomic Force Microscopes News

NASA Uses Atomic Force Microscope to Produce First Ever Image of a Single Grain of Martian Dust

Speculation That The First Atomic Force Microscope on Mars Has Found Evidence of Life on Mars

BudgetSensors Introduce AFM Probes with 4 Different Cantilevers on a Single Holder Chip

Virtual Environment Enables Scientists to Interpret Data from Dynamic AFMs

Nanosurf Atomic Force Microscope Has Been Used on Mars by Phoenix Mars Lander

New Grant Program to Promote the Use of AFMs

Global Demand has Resulted in Atomic Force Microscope Manufacturer Nanosurf Opening a US Subsidiary

Veeco Introduce Powerful New Technique for Imaging with Atomic Force Microscopes

Atomic Force Microscope from Nanosurf Lands Successfully on Mars

New Calibration Standards for AFM Height Introduced by BudgetSensors

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