Nanoelectronics News

RSS

Synopsys Custom Design Solution Receives TSMC Certification for 16-nm FinFET Process DRM V0.5

Synopsys, Inc., a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today announced TSMC's certification of Synopsys' Laker® custom design solution for the TSMC 16-nanometer (nm) FinFET process Design Rule Manual (DRM) V0.5 as well as the availability of a 16-nm interoperable process design kit (iPDK) from TSMC.

From Synopsys, Inc. 10 Sep 2013

Forex Enters Evaluation Agreement with Micrologic Design Automation

Forex International Trading Corp. ("Forex") today announced that it has signed an evaluation agreement with Micrologic Design Automation, Inc. ("MDA"), a leader in software development for electronic companies manufacturers, specializes in development of interactive software tools and online verification software to enhance cutting- edge next-generation development of electronic devices.

7 Sep 2013

Semiconductor Research Corporation (SRC) to Honor Stanford and UT Austin Professors for Chip Research

Semiconductor Research Corporation (SRC), the world's leading university-research consortium for semiconductors and related technologies, will honor professors from Stanford University and University of Texas at Austin with awards for chip-related research and education at SRC’s annual TECHCON conference Sept. 9-10.

7 Sep 2013

Synopsys Introduces 28-nm DesignWare HDMI 2.0 TX/RX IP Solutions

Synopsys, Inc., a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today launched its DesignWare® HDMI 2.0 TX/RX IP solutions, including controller, PHY, and example Linux drivers to reduce designers' integration risk and time-to-market.

From Synopsys, Inc. 6 Sep 2013

HashFast’s GN Bitcoin Network Transaction Verification ASIC Successfully Tapes Out on TSMC’s 28HPM Process

HashFast Technologies and design and manufacturing operations partner Uniquify today confirmed that HashFast’s Golden Nonce (GN) Bitcoin network transaction verification Application Specific Integrated Circuit (ASIC) has successfully taped out on TSMC’s 28HPM process.

6 Sep 2013

Bruker Introduces New LumiMap Electroluminescence System for HB-LED epi Wafer Process Metrology

At the 15th China International Optoelectronic Exposition (CIOE 2013), Bruker introduced the new LumiMap™ Electroluminescence System for uncompromised HB-LED epi wafer process metrology. LumiMap joins a suite of...

From Bruker Nano Surfaces and Metrology 5 Sep 2013

Researchers Partner to Develop State-of-The-Art Device for Detecting Neural Activity

The Howard Hughes Medical Institute (HHMI), the Allen Institute for Brain Science, the Gatsby Charitable Foundation, the Wellcome Trust, and UCL (University College London) are announcing a $5.5 million (4.2 million Euro) collaboration to develop and manufacture a state-of-the-art device for detecting neural activity in animal brains.

5 Sep 2013

Successful Interoperability Demonstrated Between Altera’s FPGAs and Micron’s Hybrid Memory Cube

Altera Corporation and Micron Technology, Inc. (“Micron”) today announced they have jointly demonstrated successful interoperability between Altera Stratix® V FPGAs and Micron’s Hybrid Memory Cube (HMC). This technology achievement enables system designers to evaluate today the benefits of HMC with FPGAs and SoCs for next-generation communications and high-performance computing designs.

From Micron Technology, Inc. 5 Sep 2013

New Method to Derive Band Offset Using Laser-Induced Current in Nanowire Device

Engineers working in the nanoscale will have a new tool at their disposal thanks to an international group of researchers led by Drexel University’s College of Engineering. This innovative procedure could alleviate the persistent challenge of measuring key features of electron behavior while designing the ever-shrinking components that allow cell phones, laptops and tablets to get increasingly thinner and more energy efficient.

5 Sep 2013

SMIC Kicks Off 13th Technology Symposium Series in Shanghai

Semiconductor Manufacturing International Corporation ("SMIC"), mainland China's largest and most advanced semiconductor foundry, kicked off its 13th technology symposium series in Shanghai today. The theme of this year's series is "Advanced and Value-added Technology Platforms for Your Vision."

From Semiconductor Manufacturing International Corporation (SMIC) 5 Sep 2013

Nanoelectronics News

Synopsys Custom Design Solution Receives TSMC Certification for 16-nm FinFET Process DRM V0.5

Forex Enters Evaluation Agreement with Micrologic Design Automation

Semiconductor Research Corporation (SRC) to Honor Stanford and UT Austin Professors for Chip Research

Synopsys Introduces 28-nm DesignWare HDMI 2.0 TX/RX IP Solutions

HashFast’s GN Bitcoin Network Transaction Verification ASIC Successfully Tapes Out on TSMC’s 28HPM Process

Bruker Introduces New LumiMap Electroluminescence System for HB-LED epi Wafer Process Metrology

Researchers Partner to Develop State-of-The-Art Device for Detecting Neural Activity

Successful Interoperability Demonstrated Between Altera’s FPGAs and Micron’s Hybrid Memory Cube

New Method to Derive Band Offset Using Laser-Induced Current in Nanowire Device

SMIC Kicks Off 13th Technology Symposium Series in Shanghai

Electron-Phonon Interactions Boost 2D Semiconductor Conductivity

New Nanomaterial Offers Sustainable Drinking Water Solution

Scalable ZnO/Zn(OH)2 Nanosheets for Stable Lithium Anodes

Researchers Use Novel PEG Treatment to Prevent Hydrogel Collapse

Carbon Nanofibers Boost Strength and Durability of Fiber Composites

Enhancing Slurry Stability in Lithium-Ion Batteries with Turbiscan Technology

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Sponsored Content

Atomic Force Microscopy Analysis of Polymer Stiffness Under Thermal Stress

Different DLS-Based Systems Can Give Us Different Size Results, and All of Them Can Be correct!

Next Generation Magnetic Force Microscopy with PeakForce Probes

Unlocking Material Behavior at the Microscale Using Nanoindentation