Nanoelectronics News

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Freescale Introduces High-Performance, Low-Power Device Based on 45-nm Silicon-on-Insulator Technology

Freescale Semiconductor has introduced the MPC8569E PowerQUICC™ III communications processor - a high-performance, low-power device based on 45-nm silicon-on-insulator (SOI) technology. The processor is ideal for a...

9 Feb 2009

Scientists Create Microchip That Uses 30 Times Less Electricity

In the first real-world test of a revolutionary type of computing that thrives on random errors, scientists have created a microchip that uses 30 times less electricity while running seven times faster than today's best technology.

9 Feb 2009

Nanowire Lasers Setting World Record in Wavelength Tunability

A single semiconductor laser chip with world-record wavelength tuning range of 200 nanometers - from 500 to 700 nanometers - has been demonstrated by a research team led by Cun-Zheng Ning, a professor in the Department of Electrical Engineering in the Ira A. Fulton School of Engineering at Arizona State University.

8 Feb 2009

The Largest and Most Anticipated Nanotechnology Event in North America

We are just three months away from Nanotech 2009 Conference & Expo in Houston, Texas. We have received a record number of business and technical submissions for our conference program, which is a clear indication that the event will be an even bigger success than it was last year in Boston.

7 Feb 2009

Controlling the Spin of Semiconductor Quantum Dot Shell States

Scientists at the Naval Research Laboratory (NRL) have recently demonstrated the ability to control the spin population of the individual quantum shell states of self-assembled indium arsenide (InAs) quantum dots (QDs). These results are significant in the understanding of QD behavior and scientists' ability to utilize QDs in active devices or for information processing.

5 Feb 2009

Test Tube Chemistry Taking a Leap Down in Size to the Nano-Scale

At the University of Surrey, test tube chemistry just took a leap down in size to the nano-scale, with new test-tubes measuring only about one billionth of a metre across. The scaling factor is like scaling up from a normal test tube to one a hundred kilometres across.

5 Feb 2009