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Report Examines How the MEMS Business is Boosting Thick-SOI Demand

The term thick-SOI refers to a semiconductor substrate with an active, single-crystal silicon layer whose thickness exceeds 1µm. It lies on a buried oxide which is set on top of a silicon wafer carrier. This struct...

3 Dec 2008

ATMI Launches New Generation of Post-CMP Cleaning Solutions for 22 Nanometer Nodes

From the SEMICON Japan Conference -- ATMI, Inc. (Nasdaq:ATMI), today launched PlanarClean(tm), a new generation of post-Chemical Mechanical Planarization (CMP) cleaning solutions specifically designed for advanced techno...

2 Dec 2008

System Enables Chip Manufacturers to Shrink Feature Sizes to 32 Nanometers and Beyond

ASML Holding NV (ASML) (NASDAQ:ASML) (Amsterdam:ASML) today announces at SEMICON Japan the first system based on its new NXT lithography platform. The TWINSCAN™ NXT:1950i provides the increased productivity and ext...

2 Dec 2008

Combining Computational and Wafer Lithography to Improve Semiconductor Manufacturability

ASML (NASDAQ:ASML)(Amsterdam:ASML) and its subsidiary Brion Technologies today announce LithoTuner™, a new suite of products that integrates computational and wafer lithography to improve semiconductor manufacturab...

2 Dec 2008

Physicists Constructed Micromachines using Same Trick Model Makers use to Get Ships into Bottle

Sometimes physicists resort to tried and trusted model-making tricks. Scientists at the Max Planck Institute for Metals Research, the University of Stuttgart and the Colorado School of Mines have constructed micromachines using the same trick that model makers use to get ships into a bottle where the masts and rigging of the sailing ship are not erected until it is in the bottle.

2 Dec 2008

PANalytical to Launch its New 2830 ZT Wafer Analyzer at SEMICON Japan 2008

PANalytical (Almelo, the Netherlands) will launch its new 2830 ZT Wafer Analyzer at SEMICON Japan 2008, 3-5 December. The 2830 ZT offers the ultimate capability for simultaneous non-contact determination of layer thickness and composition. Designed specifically for the industry, it provides manufacturers with a powerful tool for achieving the tightest process monitoring throughout the entire production chain.

2 Dec 2008