MERLIN Scanning Electron Microscope by Carl Zeiss

This video from Carl Zeiss shows the AFM system, which is ready in a matter of minutes to provide atomic surface topographical resolution in 3D. As a result of the AFM techniques, this data is already calibrated on atomic scale level opening the next resolution dimension to users of scanning electron microscopes.

Run Time – 1:24min

ZEISS MERLIN FE-SEM - Atomic Force Microscopy (AFM)

Other Videos by this Supplier

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Your comment type

Nanotechnology Videos by Subject Matter