MERLIN Scanning Electron Microscope by Carl Zeiss
This video from Carl Zeiss shows the AFM system, which is ready in a matter of minutes to provide atomic surface topographical resolution in 3D. As a result of the AFM techniques, this data is already calibrated on atomic scale level opening the next resolution dimension to users of scanning electron microscopes.
Run Time – 1:24min
ZEISS MERLIN FE-SEM - Atomic Force Microscopy (AFM)