Posted in | Nanoanalysis

AURIGA Compact FIB-SEM by Carl Zeiss

This video shows the high-tech AURIGA Compact FIB-SEM. Users can leverage the Carl Zeiss CrossBeam technology and blend high resolution imaging with the milling performance of the focused ion beam. High material and topographical contrast of different kinds of samples can be obtained.

Run Time – 1:31min

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