Novelx, Inc. announced that the NanoStructures Laboratory at the Massachusetts Institute of Technology (MIT) recently purchased and installed the company's award-winning benchtop field emission SEM, the Novelx mySEM.
The group which is a part of the Research Laboratory of Electronics (RLE) at MIT is focused on fabrication of nanometer-length-scale devices that exploit quantum-mechanics and on the application of these devices to the real world. The MIT researchers will now have a best-in-class benchtop SEM in their own lab as they explore the next frontier of electronic and photonic devices with their research into nanoscience and nanotechnology.
Lawrence Muray, CEO and co-founder of Novelx, describes, “We are pleased that MIT has selected the Novelx mySEM and look forward to a close collaboration. In particular, we are excited about the potential collaboration in the area of nanolithography and adding this important capability to the mySEM platform.”
Powered by the patented Novelx Stacked Silicon Technology, the Novelx mySEM is a bench-top SEM for imaging and characterizing nanoscale objects and materials. In a compact design that installs easily into available lab space or closer to production lines, the mySEM delivers capabilities previously only available in high-end field emission SEMs, at a fraction of the cost. Optimized for low-voltage operation and without the need to coat non-conductive samples, the mySEM is an ideal choice for the imaging of energy sensitive nanomaterials, biomaterials, polymers, thin films and membranes. The mySEM has been recognized by both R&D Magazine and the Wall Street Journal as one of the most technologically innovative products of 2009.
The Novelx mySEM is commercially available and in use by several leading university research centers for the imaging of nanoscale objects and materials in a wide variety of fields that include materials science and the life sciences. Industrial applications include the characterization of nanomaterials at corporate product development labs, the failure analysis of nanoscale defects and the quality assurance of nanomaterial-based products.
For additional information on the news that is the subject of this release, contact Jim Rynne or visit www.novelx.com.