Posted in | Nanomaterials | Microscopy

2016 Cornell Center for Materials Research Symposium Focuses on New Electron Microscopy Techniques

The latest electron microscopy techniques are capable of exploring chemical, physical, and structural properties of materials with spatial resolution, extending from atomic to macroscopic length scales, commercial applications, and impact throughout a wide range of disciplines in the life and the physical sciences.

On May 25, the 2016 Cornell Center for Materials Research Symposium, “Novel Characterization Methods – Advances in Electron Microscopy,” at the Physical Sciences Building, will exhibit the latest improvements including in-situ transmission electron microscopy to trace crystal growth and electrochemical processes, cryo-electron microscopy to disclose the 3-D structure of molecules and interfaces between solids and liquids, and scanning electron microscopy, which has been aberration-corrected, to map magnetic fields.

At 8:45 a.m., the program will commence with the 2016 Sproull Lecture, “Molecular Machines Captured in Motion at High Resolution by Single-Particle Cryo-EM,” by Joachim Frank, professor of biochemistry and molecular biophysics and of biological sciences at Columbia University.

Other speakers participating in the program include Richard Leapman, chief of the Laboratory of Cellular Imaging and Macromolecular Biophysics at the National Institute of Biomedical Imaging and Bioengineering; Darrin Pochan, professor of materials science and engineering at the University of Delaware; Rafal Dunin-Borkowski, director of the Institute for Microstructure Research and the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Germany; and Philip Batson, professor of physics and astronomy at Rutgers University.

Cornell speakers include Lena Kourkoutis and David Muller, professors of applied and engineering physics, and graduate student Megan Holtz.

The Clark Atrium will host a poster session.

Cornell students and faculty are eligible for free registration.

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