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Results 11 - 20 of 20 for Nanoscale topography
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    Our pursuit is progress for people everywhere. That's why we take a closer look at things, ask questions, and think ahead. We've been around for more than 350 years, yet our majority owners...
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    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
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    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
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    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
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    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
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    Nanoscience Instruments is your one source for a variety of AFM systems, probes, accessories, and related nanoscience tools. Products include the easy-to-use Nanosurf® easyScan 2 AFM/STM and...
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    Argonne National Laboratory is one of the U.S. Department of Energy's largest research centers. It is also the nation's first national laboratory, chartered in 1946. Argonne is a direct...
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    PrimeNano manufactures its own shielded probes. We use a wafer scale MEMS fabrication process to manufacture probes with co-axially shielded cantilevers and solid metal probe tips. The probes are...
  • Supplier Profile
    Founded in 2007, our mission at ICSPI is to expand access to nanoscale measurement tools. We make desktop atomic force microscopes (AFMs) with unmatched time-to-results, ease of use and...
  • Supplier Profile
    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...

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