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Results 231 - 240 of 1160 for SEM
  • Protochips
    Supplier Profile
    Protochips is the leader for in situ (real-world) electron microscopy products. The revolutionary systems include Atmosphere for pressurized gas and heating, Poseidon Select for liquid; electrical and...
  • Thomas Swan & Co Ltd
    Supplier Profile
    Thomas Swan & Co. Ltd. is one of the UK's leading independent performance chemical manufacturers. Founded in 1926, the company has over 78 years of experience in commercial chemical...
  • George Washington University Selects Raith Electron Beam Lithography and Large Area SEM Imaging Solutions to Take Their Research to the Next Level
    News - 18 Apr 2016
       Image credit: Raith   The George Washington University (GW) recently received multiple instruments from the Raith product portfolio to serve its interdisciplinary nanoscale...
  • CH Instruments
    Supplier Profile
    CH Instruments was established in 1994. The first instrument series, the Model 600 series electrochemical analyzer / workstation, was introduced at the end of 1994. Since then, new products have been...
  • Bruker
    Supplier Profile
    The Bruker name has become synonymous with the excellence, innovation and quality that characterizes our comprehensive range of scientific instrumentation. Bruker's trusted solutions encompass a...
  • ZAHNER-Elektrik GmbH & Co.KG
    Supplier Profile
    For more than 20 years, ZAHNER measurement systems have proven to be first choice for laboratory measurement equipment in various branches of university and industry research. The reason is the high...
  • Powerful EDS Analysis with EDAX Octane Elite Ultra
    Equipment
    Experience powerful EDS analysis with the EDAX Octane Elite Ultra, delivering superior elemental sensitivity and precise results for SEM applications.
  • Preparing TEM and SEM Samples
    Equipment
    This product discusses how to prepare TEM and SEM samples.
  • ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation
    Equipment
    The ZEISS Crossbeam doubles up as a 3D nano-workstation. The imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) can be combined with the processing ability of...
  • Advanced Microscopy, SPM, AFM and SEM Image Processing - SPIP™ Software
    Equipment
    SPIP™ is a professional software package that provides industrial and academic researchers with an advanced toolkit for working with microscope images, profiles and force curve data, including...

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