Afm - AZoNano Search

Super Sharp 1nm NT-MDT AFM Probes from Scanwel

Equipment

Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long...

Bruker’s Hysitron TriboScope®: Enhanced Characterization Capabilities for AFM

Equipment

The Hysitron TriboScope® from Bruker delivers quantitative, rigid-probe nanoindentation and nanotribological characterization features to the field of atomic force microscopy.

Pointprobe- Silicon AFM Probes from Nanoworld

Equipment

The Pointprobe is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon...

Carbon Core High-Resolution (CCHR) AFM Probe from Carbon Design Innovations

Equipment

Carbon Design Innovations' (C|D|I) carbon core high-resolution probes (CCHR) atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is then further processed and stabilized with...

Carbon Design Innovations Carbon Core High-Aspect Ratio (CCHAR) AFM Probe

Equipment

The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard...

Plateau Tip Silicon-SPM-Probes from NANOSENSORS

Equipment

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a...

Coated AFM Tip - Extended Life High Aspect Ratio from Team Nanotec

Equipment

Tips are coated with conductive, wear resistent metal carbide. Smooth and well defined tip surface.

Super Sharp Silicon AFM Tips from NanoWorld

Equipment

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

Universal AFM Probes from Nanotools

Equipment

Our most versatile tip. It delivers excellent results in almost all AFM applications.

Flat Tip AFM Probe from Applied NanoStructures

Equipment

Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application.