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Simple, Inexpensive Way To Measure Material Properties Could Impact Cosmetics, Coating and Nanoelectronic Industries

Carl Zeiss SMT Officially Launches ORION™ Helium Ion Microscope at Microscopy & Microanalysis 2007

Carl Zeiss SMT Officially Launches ORION™ Helium Ion Microscope at Microscopy & Microanalysis 2007

Application Focussed Evolution of ZEISS EVO® SEM Series Pushing Limits in Materials and Life Science Microscopy

Application Focussed Evolution of ZEISS EVO® SEM Series Pushing Limits in Materials and Life Science Microscopy

ZEISS ULTRA plus - Breakthrough in Ultra-High-Resolution Imaging of Non-Conductive Samples

ZEISS ULTRA plus - Breakthrough in Ultra-High-Resolution Imaging of Non-Conductive Samples

FEI Launch Their Most Powerful Scanning Electron Microscopes Ever

Particle Sorting Demonstrated in a Custom Flowcell with Integrated Electrodes

Scientists Train Nano 'Building Blocks' To Take On New Shapes

Imago Release New Family of Atom Probe Microscopes

High-Dynamics XYZ Piezo Positioning Stage Scans Faster and More Accurately

Porphyrin Electron Transfer Reactions Observed At The Molecular Level

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