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Researchers Use AFM-Based Infrared Spectroscopy for Polymer Nanostructure Characterization

Nanotechnology-based materials identification enables critically needed chemical metrology for nano-manufacturing

11 Oct 2012

Vienna University Researchers Study Catalytic Converter Efficiency Using Electron Microscope

Catalytic converters work poorly if they have not yet warmed up. Tiny metal particles in a catalytic converter require a minimum temperature to function efficiently. At the Vienna University of Technology, thanks to a new measuring method, it has now become possible to examine many different types of these particles at the same time. Reliable information regarding what it is exactly that the efficiency of catalytic converters depends on has thus been obtained for the first time.

10 Oct 2012

Researchers Explore Reaction Mechanism of Lithium-Air Battery Using X-Ray Photoelectron Microscopy

Exactly what goes inside advanced lithium-air batteries as they charge and discharge has always been impossible to observe directly. Now, a new technique developed by MIT researchers promises to change that, allowing study of this electrochemical activity as it happens.

8 Oct 2012

Mouse Genome Found to Consist of 10-nm Chromatin Fibres

Scientists in Canada and the United States have used three-dimensional imaging techniques to settle a long-standing debate about how DNA and structural proteins are packaged into chromatin fibres.

5 Oct 2012

Precision Quantum Measurement Achieved with Weak-Measurement Techniques

Scientists who study the ultra-small world of atoms know it is impossible to make certain simultaneous measurements, for example finding out both the location and momentum of an electron, with an arbitrarily high level of precision. Because measurements disturb the system, increased certainty in the first measurement leads to increased uncertainty in the second.

5 Oct 2012

emc2012 Reports Huge Success, 30% Increase in Delegate Numbers

The 15th European Microscopy Congress - emc2012 - held at Manchester Central in September, was the largest yet in the series. It attracted 1,714 registered Conference Delegates. This is a 30% increase on 2008.

From Royal Microscopical Society 3 Oct 2012

New Microscopy Technique Monitors and Controls Etching Process on Nanoscale

A research team led by Professors Gabriel Popescu and Lynford Goddard from the University of Illinois has developed an inexpensive technique using a special kind of microscope to etch delicate features on the surface of semiconductors, while simultaneously monitoring the entire process in real time with nanoscale resolution.

29 Sep 2012

Epitaxial Thin Films Grown Coherently with Minimal Defects

An Oak Ridge National Laboratory research team has successfully grown epitaxial thin films with minimal defects. These films are used in fabrication of semiconductors and in nanotechnology applications. The researchers have discovered an elusive strain relaxation phenomenon in cobaltites which may lead to better energy-related materials, fuel cells, and magnetic sensors.

From Oak Ridge National Laboratory 24 Sep 2012

Carl Zeiss Microscopy Launches Orion NanoFab Multi-Ion Beam Tool at EMC

Carl Zeiss Microscopy introduced the ORION NanoFab at the European Microscopy Congress (EMC) in Manchester, UK. It is the first multi-ion-beam tool based on Gas Field Ion Source (GFIS) technology, offering interchangeable gallium, neon and helium ion beams.

From Carl Zeiss Microscopy GmbH 17 Sep 2012

University of Montana Becomes 1000th Customer of TESCAN’s VEGA-3 Variable Pressure SEM

TESCAN, a major manufacturer and provider of focused ion beam workstations and scanning electron microscopes, has announced the delivery of its 1000th VEGA-3 variable pressure scanning electron microscope to the Geosciences Department of the University of Montana.

From TESCAN Group 12 Sep 2012