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Coupling Electrosurgery with Mass Spectrometry for Real-Time Identification of Tumor Tissues

A significant advantage to this technique is that while a cut is being made, blood vessels are closed off and hemorrhaging eliminated. Now another advantage may be added as well: a German-Hungarian research team has developed a mass-spectrometry-based technique by which tissues can be analyzed during a surgical procedure.

29 Sep 2009

Advances in Nanotechnology Spur Manufacturers to Focus on Developing Microscopes

Research and Markets, the leading source for international market research and market data, has announced the addition of Frost + Sullivan's new report "Technological Advances in Microscopy" to their offeri...

From Research and Markets 29 Sep 2009

London Centre for Nanotechnology Joining Forces with Veeco Instruments

The London Centre for Nanotechnology (LCN) and Veeco Instruments, UK are joining forces to set-up a training course for professionals and academics dedicated to the utilisation of Atomic Force Microscopes (AFM).

From Veeco 28 Sep 2009

Overcoming One of Significant Research Challenges Facing Electrochemists

Scientists at The University of Nottingham have overcome one of the significant research challenges facing electrochemists. For the first time they have found a way of probing right into the heart of an electrochemical r...

28 Sep 2009

UAB Awarded NSF Grant for Microscale Imaging

The National Science Foundation has awarded $431,200 to the University of Alabama at Birmingham (UAB) Department of Physics to facilitate the purchase of a new highly-specialized imaging system - the first of its kind in Alabama - that will be a centerpiece of a new interdisciplinary research laboratory on campus.

25 Sep 2009

First Probe Stations Installed to be Used to Promote Global Research and Science Achievement

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced King Abdullah University of Science and Technology's selection of multiple probe stations to support measurements in the area of materials analysis, nano-technol...

25 Sep 2009

Jordan Valley Semiconductors Announces Delivery of JVX6200 XRR Metrology Tool to HDD Vendor

Jordan Valley Semiconductors Ltd., the market leader in X-ray metrology tools is pleased to announce the delivery of its JVX6200 XRR (X-Ray Reflectometry) metrology tool to a leading-edge HDD (Hard Disk Drive) vendor, us...

24 Sep 2009

DEK Launches New Paste Roll Height Monitor

DEK has launched its brand new Paste Roll Height Monitor, an easy-to-use productivity tool designed to eliminate defects and improve end-of-line yield. Using lasers to detect the presence of solder paste, the new technol...

22 Sep 2009

NIST Issues New Nano-Ruler

The National Institute of Standards and Technology (NIST) has issued a new ruler, and even for an organization that routinely deals in superlatives, it sets some records. Designed to be the most accurate commercially ava...

22 Sep 2009

Solar Metrology Expands its SMX XRF Tool Portfolio

Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the S...

21 Sep 2009