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EmTech08 to Explore Cutting-Edge Innovations in Nanotechnology

Technology Review, Inc., the authority on the future of technology, today announced agenda highlights of its EmTech08 Conference, to be held September 23-25, 2008, on the MIT campus in Cambridge, Mass. Now in its eighth ...

31 Jul 2008

Cabot Microelectronics Patent Infringement Litigation Against DA Nano

Cabot Microelectronics Corporation, the world’s leading supplier of chemical mechanical planarization (CMP) polishing slurries to the semiconductor industry, today announced that on July 25, 2008, the United States...

31 Jul 2008

Luxury Base-Layer Apparel Equipped with Anti-Odor and Antimicrobial SmartSilver Nanotechnology

Now you can sweat in style and confidence with Pooghe Laundry's second collection of luxury base-layer apparel, made with ultra-soft Supima cotton and nanoscale silver, which will be debuting in September.

31 Jul 2008

uBoost Selected as a 2008 FireStarter Company by Strategic News Service

uBoost Inc, a student recognition program, has been selected as a 2008 FireStarter company by the Strategic News Service, host of the influential Future in Review (FiRe) technology conference. "We have selected 1...

31 Jul 2008

NIST to Use SWeNT Single-Wall Carbon Nanotubes for Standard Reference Material

The National Institute of Standards and Technology (NIST) will use SouthWest NanoTechnologies Inc.'s SWeNT® SG65 single-wall carbon nanotubes, manufactured by the CoMoCAT® process, as the starting material fo...

31 Jul 2008

Ondine Acquires License for the Human Therapeutic Use of Gold-Nanoparticle Photosensitizer

Ondine Biopharma Corporation, a medical technology company developing photodisinfection-based products, today announced that it has acquired an exclusive license for the human therapeutic use of a gold-nanoparticle photo...

31 Jul 2008

Hitachi and Hokkaido University Showcases Revolutionary Electron Analysis Microscope

Hitachi Ltd and Hokkaido University prototyped an electron analysis microscope that produces an enlarged image by irradiating an electron beam from a scanning electron microscope (SEM) to a specimen and analyzing the diffraction pattern of the scattered light.

31 Jul 2008