Atomic Force Microscopes News

RSS

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

Get ready to surf your sample with new economical atomic force microscope (AFM) probes. “Econo Board™ Probes” are the first group of probes released from Asylum Research’s new line of SurfRider™ Probes.

From Asylum Research - An Oxford Instruments Company 20 Sep 2016

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

Frost & Sullivan announced today that Park Systems, the leading manufacturer of Atomic Force Microscopes is the recipient of its2016 Global Enabling Technology Leadership Award. Each year, Frost & Sulliva...

27 Jul 2016

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields. FEI (NASDAQ: FEIC) and Cornell University have entered an ag...

From Thermo Fisher Scientific – Electron Microscopy Solutions 26 Jul 2016

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

To the surprise of chemists, a new technique for taking snapshots of molecules with atomic precision is turning up chemicals they shouldn’t be able to see.

11 May 2016

Researchers Directly Visualize Nuclear Pore’s Selective Barrier and Dynamic Behavior Using High-Speed AFM

Using an ultra fast-scanning atomic force microscope, a team of researchers from the University of Basel has filmed “living” nuclear pore complexes at work for the first time. Nuclear pores are molecular machines that control the traffic entering or exiting the cell nucleus. In their article published in Nature Nanotechnology, the researchers explain how the passage of unwanted molecules is prevented by rapidly moving molecular “tentacles” inside the pore.

3 May 2016

New Reference Samples Allow CD-AFM Tip Calibration with Uncertainty of Below 1nm

As the sizes of computer chips in electronic devices continue to shrink, traditional measurement tools (e.g., microscopes utilizing visible light) are no longer capable of examining surface features, which can be just tens of nanometers. In order to examine these tiny features, researchers use tools such as the critical dimension atomic force microscope (CD-AFM), which measures features by dragging its ¡Ö10 nm tip across the subject¡¯s surface much like a record player needle pulling across a record¡¯s grooves.

31 Mar 2016

JPK Instruments NanoWizard® AFM family

The NanoWizard® AFM family answers the advanced and complex questions of tomorrow's research delivered TODAY. It provides specialized solutions e.g., for soft matter and life sciences applications (BioScience version), materials and polymer research (NanoScience version) or nano-optics applications (NanoOptics version).

From Bruker BioAFM 3 Feb 2016

Multiple uses for the JPK NanoWizard AFM System in the Smart Interfaces in Environmental Nanotechnology Group at the University of Illinois at Urbana-Champaign

Dr Rosa Espinosa-Marzal and members from her research group discuss results from their JPK NanoWizard® AFM system at the University of Illinois at Urbana-Champaign.

From Bruker BioAFM 20 Jan 2016

MIT Atomic Force Microscope Scans Images 2,000 Times Faster

Massachusetts Institute of Technology (MIT) engineers have designed a new atomic force microscope (AFM) that has the capability to scan images 2,000 times faster than models currently on the market. The microscope enables nearly real-time video of nanoscale chemical processes.

14 Dec 2015

Renishaw’s inVia confocal Raman microscope connects to Bruker’s Dimension Icon AFM

Renishaw is an experienced supplier of integrated Raman-AFM solutions, having offered them for over 16 years. The latest addition to the range of instruments it supports is Bruker’s Dimension Icon AFM.

30 Nov 2015

Atomic Force Microscopes News

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

Researchers Directly Visualize Nuclear Pore’s Selective Barrier and Dynamic Behavior Using High-Speed AFM

New Reference Samples Allow CD-AFM Tip Calibration with Uncertainty of Below 1nm

JPK Instruments NanoWizard® AFM family

Multiple uses for the JPK NanoWizard AFM System in the Smart Interfaces in Environmental Nanotechnology Group at the University of Illinois at Urbana-Champaign

MIT Atomic Force Microscope Scans Images 2,000 Times Faster

Renishaw’s inVia confocal Raman microscope connects to Bruker’s Dimension Icon AFM

Nanoparticles Deliver Gene Therapy Directly to Bone Marrow

Cross-Linked Organic Nanoparticles Boost Material Performance

Nanofiber Dressings Tackle Inflammation and Infection in Diabetic Wounds

Tiny Graphene Membrane Holds Promise for Fighting Climate Change

Graphene Breakthrough Paves Way for Advanced Energy and Computing

Recent Advances in High-Speed Atomic Force Microscopy to Improve Research Into Protein Dynamics

Applying AI-Driven Solutions to Semiconductor Digital Design

Redux AFM: Expanding Access to Automated Nanoscale Imaging

Sponsored Content

Everything You Should Know About Photothermal Spectroscopy

Advancing Nanostructure Research: Insights from UV-Visible-NIR Microspectroscopy

Cleanroom Monitoring Solutions for Semiconductor, Battery Cell, Pharmaceutical, and Flat Panel Display Industries

'PhaSR-DLS’: a New Advancement in Spatially Resolved DLS for Enhanced Inline and Off-line Nanoparticle Sizing