Atomic Force Microscopes News

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Atomic Force-Based Nanoprobing Solutions Provider, MultiProbe, Acquired by DCG Systems

Atomic Force-Based Nanoprobing Solutions Provider, MultiProbe, Acquired by DCG Systems

New Report on Global Scanning Probe Microscopy Market

New Report on Global Scanning Probe Microscopy Market

Researchers Reduce Thickness of Solar Cell to 70nm

Researchers Reduce Thickness of Solar Cell to 70nm

DNA Nanostructures Assembled in Waterless Solvent

DNA Nanostructures Assembled in Waterless Solvent

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography:  New Advances in AFM Characterization of Polymers” on May 28, 2015

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28, 2015

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication

Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication

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