Atomic Force Microscopes News

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JPK Reports the Exploration of Living Cells Using Nanoscale and Single Molecule SPM Techniques at the Catholic University of Louvain, Belgium

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the use of their NanoWizard® 3 AFM system at the Université catholique de Louvain where it is used by the nanobio team to look at the nanoscopy of living cells.

From Bruker BioAFM 16 Jun 2015

Atomic Force-Based Nanoprobing Solutions Provider, MultiProbe, Acquired by DCG Systems

DCG Systems® announced today that it has acquired the assets of MultiProbe™, the leading provider of atomic force-based nanoprobing solutions for the semiconductor industry. MultiProbe was founded in 2001 to address the growing needs of failure analysis (FA) engineers and to help the industry find solutions for device technology development. DCG's MultiProbe operations will remain in Santa Barbara, California.

10 Jun 2015

New Report on Global Scanning Probe Microscopy Market

Research and Markets has announced the addition of the "The Global Scanning Probe Microscopy Market to 2025" report to their offering.

4 Jun 2015

Researchers Reduce Thickness of Solar Cell to 70nm

Researchers at the Okinawa Institute of Science and Technology Graduate University (OIST) have eliminated problematic pinholes in the top layer of next-generation solar cells in development. At the same time, they have significantly improved the lifetime of the solar cell and made it thinner. The findings were recently published in Scientific Reports.

4 Jun 2015

DNA Nanostructures Assembled in Waterless Solvent

Scientists around the world are using the programmability of DNA to assemble complex nanometer-scale structures. Until now, however, production of these artificial structures has been limited to water-based environments, because DNA naturally functions inside the watery environment of living cells.

27 May 2015

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

The new ZEISS MeRiT neXT mask repair tool hosts the innovative ZEISS low energy ebeam column, which enables the repair of smallest possible clear and opaque defects with the highest accuracy. The low energy beam increases the process resolution and simultaneously reduces side effects.

22 May 2015

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

A LEADING innovator in the field of thermal analysis – vital in many fields of advanced manufacturing – has teamed up with the University of Huddersfield for research that will lead to the development of a number of completely new analytical techniques.

14 May 2015

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28, 2015

Oxford Instruments Asylum Research in conjunction with the Materials Research Society (MRS) will host the webinar “Beyond Topography: New Advances in AFM Characterization of Polymers”, May 28, 2015 at 11:00am ET.

From Asylum Research - An Oxford Instruments Company 6 May 2015

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Technological limitations have made studying friction on the atomic scale difficult, but researchers at the University of Pennsylvania and the University of California, Merced, have now made advances in that quest on two fronts.

6 May 2015

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Modern research has found no simple, inexpensive way to alter a material's thermal conductivity at room temperature.

24 Apr 2015

Atomic Force Microscopes News

JPK Reports the Exploration of Living Cells Using Nanoscale and Single Molecule SPM Techniques at the Catholic University of Louvain, Belgium

Atomic Force-Based Nanoprobing Solutions Provider, MultiProbe, Acquired by DCG Systems

New Report on Global Scanning Probe Microscopy Market

Researchers Reduce Thickness of Solar Cell to 70nm

DNA Nanostructures Assembled in Waterless Solvent

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28, 2015

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Nanoparticles Deliver Gene Therapy Directly to Bone Marrow

Cross-Linked Organic Nanoparticles Boost Material Performance

Nanofiber Dressings Tackle Inflammation and Infection in Diabetic Wounds

Tiny Graphene Membrane Holds Promise for Fighting Climate Change

Graphene Breakthrough Paves Way for Advanced Energy and Computing

Recent Advances in High-Speed Atomic Force Microscopy to Improve Research Into Protein Dynamics

Applying AI-Driven Solutions to Semiconductor Digital Design

Redux AFM: Expanding Access to Automated Nanoscale Imaging

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'PhaSR-DLS’: a New Advancement in Spatially Resolved DLS for Enhanced Inline and Off-line Nanoparticle Sizing