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New Report on Global Scanning Probe Microscopy Market

Research and Markets has announced the addition of the "The Global Scanning Probe Microscopy Market to 2025" report to their offering.

4 Jun 2015

Researchers Reduce Thickness of Solar Cell to 70nm

Researchers at the Okinawa Institute of Science and Technology Graduate University (OIST) have eliminated problematic pinholes in the top layer of next-generation solar cells in development. At the same time, they have significantly improved the lifetime of the solar cell and made it thinner. The findings were recently published in Scientific Reports.

4 Jun 2015

DNA Nanostructures Assembled in Waterless Solvent

Scientists around the world are using the programmability of DNA to assemble complex nanometer-scale structures. Until now, however, production of these artificial structures has been limited to water-based environments, because DNA naturally functions inside the watery environment of living cells.

27 May 2015

ZEISS Devlops MeRiT neXT Low Energy-Beam Mask Repair System

The new ZEISS MeRiT neXT mask repair tool hosts the innovative ZEISS low energy ebeam column, which enables the repair of smallest possible clear and opaque defects with the highest accuracy. The low energy beam increases the process resolution and simultaneously reduces side effects.

22 May 2015

TASC Algorithm Extended to Create Nanoscale Method for Studying Components Distribution in Solid Mixtures

A LEADING innovator in the field of thermal analysis – vital in many fields of advanced manufacturing – has teamed up with the University of Huddersfield for research that will lead to the development of a number of completely new analytical techniques.

14 May 2015

Oxford Instruments Asylum Research and MRS OnDemand® Present “Beyond Topography: New Advances in AFM Characterization of Polymers” on May 28, 2015

Oxford Instruments Asylum Research in conjunction with the Materials Research Society (MRS) will host the webinar “Beyond Topography: New Advances in AFM Characterization of Polymers”, May 28, 2015 at 11:00am ET.

From Asylum Research - An Oxford Instruments Company 6 May 2015

Researchers Study Atomic Scale Friction Using Atomic Force Microscopy

Technological limitations have made studying friction on the atomic scale difficult, but researchers at the University of Pennsylvania and the University of California, Merced, have now made advances in that quest on two fronts.

6 May 2015

Researchers Alter Thermal Conductivity of PZT Material Using a Small Electric Voltage

Modern research has found no simple, inexpensive way to alter a material's thermal conductivity at room temperature.

24 Apr 2015

Review Paper on Combining Atomic Force Microscopy and Infrared Spectroscopy (AFM-IR) Persists as a Top-Downloaded Publication

Anasys Instruments, the pioneer in commercializing near-field infrared spectroscopy instrumentation, including AFM-IR, is pleased to direct readers to an in-depth review of AFM-IR technology published as a Focal Point article in the Journal of Applied Spectroscopy titled “AFM‐IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization.”

23 Apr 2015

New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit

Oxford Instruments Asylum Research has released a new application note, “The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials,” written Dr. Donna Hurley, founder of Lark Scientific and former NIST project leader.

From Asylum Research - An Oxford Instruments Company 22 Apr 2015