Atomic Force Microscopes News

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JPK Reports on the Use of the NanoWizard® 3 AFM System at the Hebrew University of Jerusalem

JPK Reports on the Use of the NanoWizard® 3 AFM System at the Hebrew University of Jerusalem

Nanoscience Instruments Announce New AFM with High Definition Electrical Measurement Capabilities

Nanoscience Instruments Announce New AFM with High Definition Electrical Measurement Capabilities

Bruker Announces Official Partnership with University of Manchester’s National Graphene Institute

Bruker Announces Official Partnership with University of Manchester’s National Graphene Institute

Oxford Instruments Asylum Research Will Present Two-Part Webinar Series on Piezoresponse Force Microscopy in May 2015

Oxford Instruments Asylum Research Will Present Two-Part Webinar Series on Piezoresponse Force Microscopy in May 2015

New Partnership Provides Quality Training Programs in Atomic Force Microscopy

New Partnership Provides Quality Training Programs in Atomic Force Microscopy

Researchers Optimize New AFM System for Live-Cell Imaging

Researchers Optimize New AFM System for Live-Cell Imaging

Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Conventional Patch-Clamp Technique Combined with AFM Helps Record Activity of Moving Cells

Highest Values of Piezoresistivity in Electroceramic Material Measured Using Atomic Force Microscopy

Highest Values of Piezoresistivity in Electroceramic Material Measured Using Atomic Force Microscopy

Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Electricity and Water Help Control Nanoscale Friction on Ionic Surfaces

Oxford Instruments Asylum Research Announces  AFM Image Contest Winners

Oxford Instruments Asylum Research Announces AFM Image Contest Winners

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