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Results 171 - 180 of 263 for Atomic force microscopes
  • The Benefits of Using Benchtop SEM for Nanoanalysis
    Article - 20 Nov 2023
    In this article, we discuss the benefits of using benchtop scanning electron microscopy for nanoscale analysis.
  • Analyzing Semiconductor Nanodevices Through Spectroscopy
    Article - 15 Sep 2023
    In the world of semiconductor nanodevices, where quantum effects and atomic positions dictate behavior, spectroscopic techniques emerge as powerful tools to unlock their quantum properties and explore...
  • High Vacuum C-AFM Imaging
    Article - 7 Sep 2023
    Utilizing high vacuum C-AFM imaging, this study reveals the relationship between nanoscale structure and electrochemical activity in energy storage systems.
  • Utilizing Back-Gate Voltage Biases for 2D Materials
    Article - 7 Sep 2023
    The influence of back-gate voltage on 2D materials' work functions is explored, offering key insights for optimizing non-volatile floating gate memories.
  • What is Metrology?
    Article - 27 Jun 2023
    This article provides an overview of metrology, exploring its historical roots, diverse techniques, and profound impact on shaping industries and enabling accuracy and precision in various fields.
  • Trends in Nanobiomaterials
    Article - 17 Mar 2023
    In this article, the historical and future trends in the production and use of nanobiomaterials will be discussed.
  • How Does Piezo Response Force Microscopy Work?
    Article - 10 Jan 2023
    Piezo Response Force Microscopy (PFM) enables nanoscale characterization of piezoelectric materials by measuring mechanical deformation under electric fields.
  • Conducting Virus Research with Atomic Force Microscopy (AFM)
    Article - 4 Jan 2023
    AFM enhances virus research by allowing high-resolution imaging and nanomechanical analysis of viral structures and interactions under physiological conditions.
  • Modern and Advanced Kelvin Probe Force Microscopy (KPFM)
    Article - 9 Jan 2023
    Kelvin Probe Force Microscopy (KPFM) measures surface potential with improved spatial resolution, crucial for material research. #forceMicroscopy #microscopy
  • Graphene and Atomic Force Microscopy (AFM)
    Article - 12 Jan 2023
    AFM provides unparalleled resolution for characterizing graphene's electrical and mechanical properties, essential for advanced nanodevice design.

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