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Results 381 - 390 of 1383 for Afm
  • Supplier Profile
    Aurora NanoDevices Inc. supplies high quality, calibration systems for atomic force microscopy imaging.  Founded in 2001, our systems are now found in hundreds of scanning probe microscopes...
  • Supplier Profile
    planarTECH is a global leader in providing R&D-scale process and analytical equipment for graphene and 2D materials synthesis, having provided over 80 systems globally since the inception of the...
  • Supplier Profile
    MS MacroSystem offers professional 3D and 4D graphics software for science and technology that allows you to analyze data quickly and accurately. Our unique set of interactive 3D measurement tools was...
  • Supplier Profile
    Located in Vermont, Cheap Tubes is a leading supplier of Carbon Nanotubes & Graphene products.  We will soon enter the Silver Nanowire and ITO alternative ink markets. Every order we receive...
  • Article - 16 Feb 2006
    Tribology plays a critical role in diverse technological areas. In the advanced technological industries of semiconductor and data storage, tribological studies help optimize polishing processes and...
  • Article - 5 Jan 2023
    AFM excels in analyzing graphene's atomic-scale properties, essential for advancing nanodevices and understanding 2D materials' stacking effects.
  • Article - 14 Jul 2020
    Characterization of carbon nanotube-embedded polymers using C-AFM highlights nanoscale conductivity variations, crucial for advanced material applications.
  • Supplier Profile
    Attolight, a Swiss company that originated in the EPFL Laboratory of Quantum Optoelectronics (LOEQ), has revolutionized micro-cathodoluminescence (CL).  Capitalizing on core expertise in the...
  • News - 14 Apr 2022
    The development of a 3D nanoprinting platform that allows the printing of polymer materials with remarkable control and nanometer spatial accuracy is the subject of a new study published in the...
  • News - 4 Jan 2022
    In a research paper published in Nano Energy, a group of researchers reported that when a platinum-plated atomic force microscope tip is pushed over a pristine doped silicon substrate, an extremely...

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