Aurora NanoDevices Inc. supplies high quality, calibration systems for atomic force microscopy imaging. Founded in 2001, our systems are now found in hundreds of scanning probe microscopes through North American, Europe, and Japan.
Our main products are the Tipcheck and Nioprobe AFM imaging devices which have proven to be highly effective tip characterisation tools for deconvolving tip-surface interactions from the true surface image during atomic force microscopy scans.
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
This product profile from Merck outlines information about ultrastable fluorescent silica nanobeads.
The ClearView scintillator camera that elevates your everyday transmission electron microscopy (TEM).
Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.