Aurora NanoDevices Inc. supplies high quality, calibration systems for atomic force microscopy imaging. Founded in 2001, our systems are now found in hundreds of scanning probe microscopes through North American, Europe, and Japan.
Our main products are the Tipcheck and Nioprobe AFM imaging devices which have proven to be highly effective tip characterisation tools for deconvolving tip-surface interactions from the true surface image during atomic force microscopy scans.
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Dr. Laurene Tetard
AZoNano speaks with Dr. Laurene Tetard from the University of Central Florida about her upcoming research into the development of nanotechnology that can detect animal-borne diseases. The hope is that such technology can be used to help rapidly control infected mosquito populations to protect public
Dr. Amir Sheikhi
AZoNano speaks with Dr. Amir Sheikhi from Pennsylvania State University about his research into creating a new group of nanomaterials designed to capture chemotherapy drugs before they impact healthy tissue, amending a fault traditionally associated with conventional nanoparticles.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.
Nikalyte’s NL-UHV is a state-of-the-art tool that allows the generation and deposition of nanoparticles in an Ultra-High vacuum onto a sample to create a functionalized surface.
The Filmetrics® F54-XY-200 is a thickness measurement tool created for automated sequence measurement. It is available in various wavelength configuration options, allowing compatibility with a range of film thickness measurement applications.