Article - 13 May 2016
Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
Article - 10 Apr 2013
Vamsi Velidandla, VP of Marketing for Zeta Instruments, talks to AZoNano about the applications of their unique metrology technology.
Article - 17 Apr 2015
A wide variety of medium-voltage(MV) uninterruptible power supplies (UPSs) are being offered by ABB with 6MVA ratings. There are a number of practical benefits of implementing a UPS at the MV level...
Article - 5 Oct 2018
Asylum Research has two AFM families, the Cypher TM and MFP-3DTM which can evaluate 3D textural and roughness characteristics quantitatively.
Article - 2 Jan 2004
Numerous organic and inorganic materials have already been analyzed for non-volatile memory applications. Organic memories offer the potential of simple integration and simple cell concepts with very...
Article - 9 Jul 2012
The computing industry demands ever smaller, faster, and more efficient processors, and we are beginning to encounter limits to just how small the necessary components can be made. Making switches...
Article - 31 May 2016
AZoNano spoke to Jeffrey Whalen, CEO of FullScaleNano, about the features of their new software and how he expects it to change the nanomaterials landscape across both industry and academia.
Article - 28 Apr 2016
The nanoDMA III from Hysitron is the latest powerful dynamic testing method to perform nanoscale mechanical property measurements.
Article - 11 Dec 2012
Situated in the west coast of the United States, California has a population of 37,691,912 as of 2011.
Article - 27 Nov 2011
The statement that a materials functionality is controlled by defects is perhaps the most recognized paradigm of materials science, solid state electrochemistry, and condensed physics alike.