Search

Search Results
Results 1 - 10 of 49 for Spectroscopic Ellipsometry
  • Semilab Semiconductor Physics Laboratory
    Supplier Profile
    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
  • HORIBA
    Supplier Profile
    HORIBA, headquartered in the United States, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA is a world...
  • J.A. Woollam
    Supplier Profile
    The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the J.A. Woollam Company has rapidly grown to become a worldwide leader in...
  • SE-1000 - Cost-Effective Spectroscopic Ellipsometry for Thin Film Characterization
    Equipment
    This page details the capabilities of the SE-1000, a spectroscopic ellipsometer used for thin-film characterization.
  • Park Systems
    Supplier Profile
    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
  • Spectroscopic Ellipsometry: What is it?
    Article - 1 Apr 2021
    Spectroscopic ellipsometry is an optical measurement method. It is utilized to measure the change in polarization of light when it travels through a medium. This then allows the extraction of the...
  • Refractive Index Determination of Y2O3 on Glass
    Article - 22 May 2008
    Y2O3 films, used in AR coatings and laser designs, show high adhesion and transparency from UV to IR, with properties influenced by substrate type.
  • SE-2000 Spectroscopic Ellipsometer covering DUV-UV-VIS-NIR detection ranges
    Equipment
    This page details information about the SE-2000, a spectroscopic ellipsometer with rotating compensator optics.
  • The Accurion EP4: The Latest Generation of Imaging Ellipsometer
    Equipment
    The Accurion EP4 is the latest generation of imaging ellipsometers, combining ellipsometry and microscopy.
  • Characterization of Thin Film Transistors
    Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.

Terms

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.

Provide Feedback