The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting
as a spin-off from the University of Nebraska, the J.A. Woollam Company has
rapidly grown to become a worldwide leader in spectroscopic ellipsometry. We
have been perfecting our technology for 20 years and have secured over 50 patents.
The company employs more than 40 people, the majority of whom are engineers
and scientists dedicated to the advancement of ellipsometry. We pride ourselves
on the quality and workmanship of our products. Each system we sell is hand-assembled
using custom- machined aluminum and high quality optics and electronics.
Strongly Bound Excitons Found in Anatase Single Crystals and Nanoparticles
J.A. Woollam M-2000-Series Spectroscopic Ellipsometers
J.A. Woollam IR-VASE Spectroscopic Ellipsometer
J.A. Woollam alpha-SE Spectroscopic Ellipsometer
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
This product profile from Merck outlines information about ultrastable fluorescent silica nanobeads.
The ClearView scintillator camera that elevates your everyday transmission electron microscopy (TEM).
Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.