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Single Particle ICP-MS Characterization of Titanium Dioxide Nanoparticles in Sunscreen

SP-ICP-MS offers rapid, accurate analysis of TiO2 nanoparticles in sunscreen, essential for assessing health and environmental impacts.

From PerkinElmer Inc. 17 Jun 2016

Nanopathology - A New Revolutionary Approach to Medicine

Dr. Antonietta Gatti, talks to AZoNano about nanopathology and how this revolutionary approach to medicine is changing diagnosis and treatment.

By Stuart Milne 13 Jun 2016

Optimizing 3D Electron Microscopy (3DEM) Results at a Low kV

3DEM techniques like SBFSEM achieve high-resolution imaging of biological samples, optimized by low kV detectors and minimized sample charging.

From Gatan, Inc. 8 Jun 2016

How to Dimple Ductile Materials for TEM Preparation

Dimpling ductile materials for TEM prep is optimized with CBN paste, enhancing cutting rates and handling, while minimizing polishing time.

From Gatan, Inc. 8 Jun 2016

What Will Electronics and Semiconductors Be Like In 100 Years?

For decades, we relied on silicon as the semiconductor for our computer chips. But now, working at nanometer scales, it looks like physical limitations may end the current methods to include more and more processing power onto each individual chip.

By Brett Smith 1 Jun 2016

The History Of Electronics & Semiconductors

Materials that contain both the properties of a conductor and an electrical insulator are known as semiconductors.

By Brett Smith 31 May 2016

Latest Trends in AFM

Atomic force microscopy (AFM) was first used in 1986 and uses a cantilever with a sharp tip to scan across a sample to produce a topographic map. The process is now expanding its use over a range of applications.

By Kimberly Lawson 27 May 2016

Using Nanomaterials to Increase the Efficiency of Photovoltaic Cells

Companies and researchers are applying nanomaterials to photovoltaics to lower their manufacturing costs and improve their capabilities. This includes improving their efficiency when converting light into electricity.

By Kimberly Lawson 26 May 2016

Using Combined Fluorescence Lifetime Imaging Microscopy and Atomic Force Microscopy to Perform Enhanced Multiparameter Cell Imaging

Fluorescence lifetime imaging microscopy (FLIM) offers optically encoded data about live cells processes. In contrast, atomic force microscopy (AFM) provides mechanical and nanometer-resolved surface topography data, and has now been extended to mechanical property mapping of nanometer-resolved live cells.

From Bruker Nano Surfaces and Metrology 25 May 2016

Using Scanning Microwave Impedance Microscopy for Nanoscale Mapping of Permittivity and Conductivity

Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.

From Bruker Nano Surfaces and Metrology 25 May 2016