Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards and improving production in the semiconductor and nanomanufacturing industries.
Scientists have detected previously unnoticed chemical signals that individual cells in the immune system use to communicate with each other over short distances.
The signals the researchers detected originated in den...
FEI Company, a leading provider of high-resolution imaging and analysis systems, today released the MLA 600F system, a high-speed automated mineralogy analyzer used in the mining industry to optimize the performance of m...
Electrons have something in common with people: the more information they acquire about their setting, the more they become aware of their individuality and the more belonging to a group loses its importance. As a result, the coherent harmony that binds the electrons into a fixed relationship with their environment is lost. This is what scientists at the Fritz-Haber Institute of the Max-Planck Society discovered when, with the aid of X-rays, they catapulted electrons out of molecules consisting of two nitrogen atoms.
Using two abundant and relatively inexpensive elements, Boston College chemists have produced nanonets, a flexible webbing of nano-scale wires that multiplies surface area critical to improving the performance of the wires in electronics and energy applications.
JPK Instruments, one of the world's leading manufacturers of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce a completely re-designed web site at www.jpk.com.
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In work that could lead to new ways of detecting and treating malaria, MIT researchers have used two advanced microscopy techniques to show in unprecedented detail how the malaria parasite attacks red blood cells.
Bruker AXS GmbH announces the closing of its acquisition of S.I.S. Surface Imaging Systems GmbH, located near Aachen, Germany. S.I.S. develops, manufactures and distributes advanced atomic force/scanning probe microscopy...
FEI Company, a leading provider of atomic-scale imaging and analysis systems, today released its new extreme field emission gun (X-FEG) electron source module for the Titan(TM) family of scanning transmission electron microscopes (S/TEMs). The new technology combines higher brightness - previously available only with more complex cold field emission - with the high, ultra-stable current of thermally-assisted field emission.
At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis.
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