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FEI's New MLA 600F an Important Step Toward Implementing Automated Mineralogy at Operational Sites

FEI Company, a leading provider of high-resolution imaging and analysis systems, today released the MLA 600F system, a high-speed automated mineralogy analyzer used in the mining industry to optimize the performance of m...

3 Sep 2008

Scientists Observe Change from Cooperative to Individual Behaviour in Electrons with Different Speeds

Electrons have something in common with people: the more information they acquire about their setting, the more they become aware of their individuality and the more belonging to a group loses its importance. As a result, the coherent harmony that binds the electrons into a fixed relationship with their environment is lost. This is what scientists at the Fritz-Haber Institute of the Max-Planck Society discovered when, with the aid of X-rays, they catapulted electrons out of molecules consisting of two nitrogen atoms.

3 Sep 2008

New Nanostructure Improves Material Used in Microelectronics and Water-Splitting

Using two abundant and relatively inexpensive elements, Boston College chemists have produced nanonets, a flexible webbing of nano-scale wires that multiplies surface area critical to improving the performance of the wires in electronics and energy applications.

3 Sep 2008

Leading Manufacturer of Nanoanalytic Instrumentation Launches New Website

JPK Instruments, one of the world's leading manufacturers of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce a completely re-designed web site at www.jpk.com. Th...

2 Sep 2008

Work Could Aid in Diagnostics and Drug Testing

In work that could lead to new ways of detecting and treating malaria, MIT researchers have used two advanced microscopy techniques to show in unprecedented detail how the malaria parasite attacks red blood cells.

2 Sep 2008

S.I.S. Surface Imaging Systems to be Called Bruker Nano After Acquisition

Bruker AXS GmbH announces the closing of its acquisition of S.I.S. Surface Imaging Systems GmbH, located near Aachen, Germany. S.I.S. develops, manufactures and distributes advanced atomic force/scanning probe microscopy...

1 Sep 2008

FEI Releases New X-FEG Electron Source Module for Titan Family of S/TEMs

FEI Company, a leading provider of atomic-scale imaging and analysis systems, today released its new extreme field emission gun (X-FEG) electron source module for the Titan(TM) family of scanning transmission electron microscopes (S/TEMs). The new technology combines higher brightness - previously available only with more complex cold field emission - with the high, ultra-stable current of thermally-assisted field emission.

1 Sep 2008

Bruker Further Extends Versatility of its Product Lines for the Nanoanalysis Markets

At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis. Th...

1 Sep 2008

Scientists Produced Image at the Highest Resolution Ever Achieved with X-Ray Light

A team of scientists from the Technische Universität Dresden (Germany) and the ESRF in Grenoble (France) has produced the image of an object at the highest resolution ever achieved with X-ray light. A 100-nanometre gold particle fixed on a substrate was reconstructed with 5 nanometre resolution.

30 Aug 2008

High-Resolution Three-Dimensional Images of Nanoscale Crystal Structures

X-rays from a synchrotron can produce incredible high-resolution three-dimensional images of nanoscale crystal structures.

29 Aug 2008

Microscopy News

FEI's New MLA 600F an Important Step Toward Implementing Automated Mineralogy at Operational Sites

Scientists Observe Change from Cooperative to Individual Behaviour in Electrons with Different Speeds

New Nanostructure Improves Material Used in Microelectronics and Water-Splitting

Leading Manufacturer of Nanoanalytic Instrumentation Launches New Website

Work Could Aid in Diagnostics and Drug Testing

S.I.S. Surface Imaging Systems to be Called Bruker Nano After Acquisition

FEI Releases New X-FEG Electron Source Module for Titan Family of S/TEMs

Bruker Further Extends Versatility of its Product Lines for the Nanoanalysis Markets

Scientists Produced Image at the Highest Resolution Ever Achieved with X-Ray Light

High-Resolution Three-Dimensional Images of Nanoscale Crystal Structures

Electron-Phonon Interactions Boost 2D Semiconductor Conductivity

Scalable ZnO/Zn(OH)2 Nanosheets for Stable Lithium Anodes

New Nanomaterial Offers Sustainable Drinking Water Solution

Carbon Nanofibers Boost Strength and Durability of Fiber Composites

Researchers Use Novel PEG Treatment to Prevent Hydrogel Collapse

Enhancing Slurry Stability in Lithium-Ion Batteries with Turbiscan Technology

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Sponsored Content

Atomic Force Microscopy Analysis of Polymer Stiffness Under Thermal Stress

Different DLS-Based Systems Can Give Us Different Size Results, and All of Them Can Be correct!

Next Generation Magnetic Force Microscopy with PeakForce Probes

Unlocking Material Behavior at the Microscale Using Nanoindentation