Nanoelectronics News

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Xilinx Optimizes 28nm Technology Node by Selecting Low-Power Process Technology

Xilinx Optimizes 28nm Technology Node by Selecting Low-Power Process Technology

Xilinx Inc. (Nasdaq: XLNX) today announced the foundation for a next-generation of Xilinx programmable platforms that will give system designers FPGAs that consume half the power at twice the capacity than previously possible for addressing the Programmable Imperative.

23 Feb 2010

Scatterometry - Measuring Ever-Smaller Chip Production

As computer chips rapidly continue to evolve, new technologies must be developed to closely monitor the fabrication process and guard against faults at a sub-microscopic level. a More than 40 years ago Intel co-fo...

22 Feb 2010

STMicroelectronics Unleashes 55nm eFlash Process Technology for Automotive MCU Chips

STMicroelectronics Unleashes 55nm eFlash Process Technology for Automotive MCU Chips

STMicroelectronics (NYSE:STM) , a top semiconductor supplier to the automotive industry, today announced its 55 nanometer (nm) embedded Flash (eFlash) process technology, which will be implemented in its next-generation automotive microcontroller (MCU) chips.

From STMicroelectronics 22 Feb 2010

Fujitsu Launches New Graphics SoC Based on its 90nm CMOS Process Technology

Fujitsu Microelectronics America, Inc. (FMA) today introduced the MB86R02 "Jade D" SoC, which incorporates the Fujitsu MB86296 "Coral" graphics processor unit (GPU) with the powerful 32-bit ARM926EJ-S...

20 Feb 2010

SFT Unveils New Versions of Post-Layout Verification Products for Nanometer Design

Silicon Frontline Technology, Inc. (SFT), an Electronic Design Automation (EDA) company in the post-layout verification market , announced today that new versions of its flagship post-layout verification products, F3D (F...

19 Feb 2010

Collaboration at CNSE's Albany NanoTech Complex will Target Mask Defects at 22 nm and Below

SEMATECH has launched a global consortium at the College of Nanoscale Science and Engineering's (CNSE) Albany NanoTech Complex to develop critical metrology tools for detecting defects in advanced masks needed for ex...

18 Feb 2010

Major Foundry Chooses Axcelis' Integra Dry Strip System for its IC Production Facility

Axcelis Technologies, Inc. (Nasdaq:ACLS), a leading supplier of innovative, high-productivity solutions for the semiconductor industry, announced today that a major foundry has selected the IntegraTM dry strip system for...

18 Feb 2010

Smart Imaging to Showcase New Image-Based Full-Chip Validation Tool at SPIE's Advanced Lithography 2010

Smart Imaging Technologies has introduced ChipInsight, an image-based, full-chip validation tool for the production flow of post-RET design validation. The product will be presented at SPIE's Advanced Lithography ...

18 Feb 2010

Omron Electronic Components Launches New Connector Catalog

Omron Electronic Components LLC announces the availability of its new Connector catalog. This catalog contains easy-to-use quick selection guides, technical support pages, design notes, and full datasheets for their comp...

18 Feb 2010

Open-Silicon, Virage Logic Join to Offer Comprehensive SoC Design Solutions

Open-Silicon, Inc., a leading ASIC design and semiconductor manufacturing company, and Virage Logic (Nasdaq: VIRL), the semiconductor industry's trusted IP partner, today announced a partnership agreement to provide ...

18 Feb 2010

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