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New Statistical Analysis Technique Could Lead To More Precise And Reliable Measurement of Nanomaterials and Nanostructures

A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.

30 Jun 2009

Merck Launches "Printed Organic Switches And Chips" Project

Merck KGaA announced today that it has launched the "Printed Organic Switches and Chips" project (Polytos) together with its partners in the excellence cluster known as the "Forum Organic Electronics"...

30 Jun 2009

Consortium to Address Key Integration Challenges Of 3-Dimensional Packaging And Embedded Module Technologies

The Institute of Microelectronics (IME), a research institute of the Agency for Science, Technology and Research (A*STAR), today announced the launch of the 10th Electronic Packaging Research Consortium (EPRC-10) to addr...

30 Jun 2009

Houston University Expands its Nanoscience And Nanotechnology Offerings

The University of Houston is expanding its nanoscience and nanotechnology offerings this fall with the launch of a unique program intended to give undergraduates in-depth training and access to state-of-the-art equipment...

30 Jun 2009

IBM Signs A Five-year Strategic Agreement with Applied Materials

IBM Corporation (NYSE: IBM) today announced that it has signed a five-year strategic agreement to provide Applied Materials, Inc., the global leader in nanomanufacturing technology solutions, with information technology (IT) application development and maintenance services.

From Applied Materials Inc. 30 Jun 2009

New Package Significantly Improves Optical CD Measurement Quality

Nova Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced the launc...

From Nova Measuring Instruments 30 Jun 2009

Inventor Of Enable IPC's Ultracapacitor Technology to Present at ISEE'Cap 09

Enable IPC Corporation (Pink Sheets: EIPC) announced that today Dr. Marc Anderson, a Professor at the Department of Civil and Environmental Engineering at the University of Wisconsin and one of the inventors of Enable IP...

30 Jun 2009

Micron Validates Silicon Motion's Latest Flash Controllers

Silicon Motion Technology Corporation (Nasdaq:SIMO) (the "Company"), a leading fabless semiconductor company that designs, develops and markets semiconductor solutions for multimedia consumer electronics, today...

From Micron Technology, Inc. 30 Jun 2009

Micron Technology Announces Mass Production Of New NAND Flash Memory Products Using 34-Nanometer Process Technology

Micron Technology, Inc. (NYSE:MU) today announced mass production of new NAND flash memory products using its award-winning 34-nanometer (nm) process technology. As consumers demand increased capacity to store more music, videos, photos, and applications in ever smaller portable electronic devices, manufacturers need a storage solution that delivers on capacity, performance, and size.

From Micron Technology, Inc. 30 Jun 2009

SMIC Completes First 45-Nanometer High Performance Process

Semiconductor Manufacturing International Corporation ("SMIC"; NYSE: SMI and SEHK: 0981.HK) today announced the successful completion of its first 45-nanometer high performance (GP, generic process with high performance) yield lot.

From Semiconductor Manufacturing International Corporation (SMIC) 30 Jun 2009