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X-FAB CEO to Present at Semico Summit 2009

Novel Techniques to Measure Distribution of Energy and Heat in Powered Carbon Nanotube Devices

Novel Techniques to Measure Distribution of Energy and Heat in Powered Carbon Nanotube Devices

Lehighton Electronics Introduces New LEI 1605 Mobility Tester for Semiconductor and Solar Manufacturing Processes

Lehighton Electronics Introduces New LEI 1605 Mobility Tester for Semiconductor and Solar Manufacturing Processes

Cabot Microelectronics Announces Acquisition of Epoch Material

NexPlanar Achieves ISO 9001:2000 Certification

NexPlanar Achieves ISO 9001:2000 Certification

Research Advances Nanowire Technology for Large-Scale Applications

IBM and PDF Solutions to Develop Manufacturing Process Complexity at 32-, 28-, and 22-Nanometer Dimensions

IBM and PDF Solutions to Develop Manufacturing Process Complexity at 32-, 28-, and 22-Nanometer Dimensions

Sidense SiPROM Non-Volatile Memory Macros to Be Available to Fujitsu Microelectronics' 90nm System-on-Chip Customers

Project Represents One of the Most Ambitious Electron Microscopy Development Efforts to be Undertaken

Project Represents One of the Most Ambitious Electron Microscopy Development Efforts to be Undertaken

LayTec Enters New Field of Business

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