Nanoelectronics News

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Measuring Blind Vias in Silicon Wafers

With semiconductor devices becoming smaller and smaller and between-level interconnects requiring the production of blind vias with high aspect ratios there is a need to be able to perform measurements on such features.

25 Nov 2008

Crystal IS Wins DoD Grant to Develop UV-LEDs

Crystal IS, Inc., the world's leading manufacturer of ultraviolet light emitting diodes (UV LEDs) based on aluminum nitride (AlN) substrate technology, today announced it will receive an $800,000 appropriation from t...

25 Nov 2008

Researchers Demonstrate Existence of Key Magnetic Property of Specially Built Semiconductor Devices

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key magnetic-as opposed to electronic-property of specially built semiconductor devices.

25 Nov 2008

Researchers Create Electrical Wires Consisting of Protein Nano Fibers

Researchers at Linköping University in Sweden have succeeded in creating electrical wires consisting of protein fibers encased in plastic. The 10 nanometer thin fibers are self-organizing and compatible with biologi...

25 Nov 2008

Measuring Low Levels of Stress and Strain on the Nanoscale

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in regions of a semiconductor device as small as 10 nanometers across.

25 Nov 2008

Leading Nanotechnology Company Opens Global Headquarters and Leading-Edge Manufacturing Facility

Combined with its world-class research and development center located at the UAlbany NanoCollege, Vistec becomes the first high-tech equipment supplier to move its entire operation to New York's Capital Region.

25 Nov 2008

Managing Director of Carl Zeiss Becomes New CEO of SUSS MicroTec

As announced today by SUSS MicroTec AG, which is listed in the Prime Standard of Deutsche Börse AG, the Supervisory Board has appointed Mr. Frank Averdung to the Management Board of SUSS MicroTec AG.

From Carl Zeiss Microscopy GmbH 25 Nov 2008

SRAM With HK/MG Process Has Yielded, Complements Foundry's 32/28nm Technology

UMC (NYSE:UMC)(TSE:2303), a leading global semiconductor foundry, today announced a significant milestone for its high-k/metal-gate (HK/MG) technology with validation of the process through 45nm SRAM product yield. This ...

25 Nov 2008

MagnaChip Semiconductor Introduces Industry Leading 0.18um and 0.35um aBCD Process Technologies

MagnaChip Semiconductor Ltd., a leading Asia-based designer and manufacturer of analog and mixed-signal semiconductor products for high volume consumer applications, today, announced the availability of its industry lead...

24 Nov 2008

Skyray XRF Introduces Newest Addition to its Low-Cost XRF Instrument Line

Skyray XRF has released the newest addition to its low-cost x-ray fluorescence instrument line; the Thick-800. Developed specifically for measuring plating thickness, the Thick-800 XRF can provide measurements of single-...

From Skyray Instrument Inc 24 Nov 2008