Researchers Discover Method for Harmful Toxin Removal from Carbon Nanotubes

Semiconductor Research, along with scientists at The University of Texas at Dallas and SEMATECH, have successfully demonstrated the easy removal of certain potentially harmful organic toxins found in a single-walled carbon nanotube (SWNTs) type.

This finding supports the application of SWNTs for producing nanoelectronic devices. This research also offers higher product efficiency not only to semiconductor producers but also to various other industries.

During the analysis about the toxicity of various functionalized SWNTs, the scientists discovered that carboxylated single-walled carbon nanotubes (CSWNTs) suppressed the growth of the mammalian cells in culture, which is regarded as a proof of toxicity. They also identified that normal separation technologies can be used for the removal of contaminants, proving that the purified nanotubes were not accountable for the toxicity.

As per the data collected, certain organic contaminants found in the CSWNTs could be accountable for the toxicity of the carbon nanotubes. The researchers continue their work further to test this possibility.

According to Semiconductor Research’s Director of Nanomanufacturing Sciences, Dan Herr, the SWNTs are considered as promising research materials with numerous opportunities for potential applications. Further development of this technology allows the SWNTs to produce scaled integrated circuits at the nanoscale level, he added.

During the research at The University of Texas at Dallas, the data obtained shows that tiny carbon traces produced during the fabrication of CSWNTs could be the reason of observed toxicity, which is different from SWNTs. Industry researchers have already reported about the existence of tiny oxidized carbon traces in CSWNTs. However, this is the first time that it has been discovered that these carbon fragments may be toxic.

Semiconductor Research’s Center for Environmentally Benign Semiconductor Manufacturing directed the research work.

Source: http://www.src.org

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