Veeco Instruments has announced that it will host the "Seeing at the Nanoscale V" conference at the University of California, Santa Barbara (UCSB), June 24-27, 2007. Celebrating its fifth year, the conference provides an optimum setting for scientists to share information on a wide-variety of cutting-edge nanotechnology topics. Angela Belcher from Massachusetts Institute of Technology, MA, and David Awschalom, UCSB, will be this year's keynote speakers.
"Seeing at the Nanoscale continues to be an outstanding international scientific forum for those involved in nanoscience from both academia and industry," said Evelyn Hu, event advisor and department head for the California NanoSystems Institute at UCSB. "Nanostructural imaging, characterization, and modification utilizing scanning probe microscopy are revolutionizing scientific research, and this is the conference to attend to examine the findings and learn more about the future of nanoscience."
The three-day conference themed, "Exploring the Future of Nanotechnology," provides both a platform and a tremendous opportunity for scientists worldwide to discuss their latest discoveries, and to share their research on next-generation nanotechnology with their peers and visionaries in the field of nanoscience. Each year the conference hosts several hundred international researchers and scientists. In conjunction with the conference, Veeco plans to offer extensive add-on training courses and workshops for its customers. Conference sessions for 2007 include:
Session 1: Extending the Limits of Scanning Probe Microscopy (SPM). Chair: Franz Giessibl, University of Regensburg, Germany. Guest Speaker: Flemming Besenbacher, University of Aarhus, Denmark
Session 2: From Single Biomolecules to Cells. Chair: Darlo Anselmetti, Bielefeld University, Germany. Guest Speaker: Andreas Engel, Mueller Institute, Switzerland
Session 3: Next Generation Materials and Polymer Systems. Chair: Sergei Magonov, Veeco Instruments. Guest Speaker: Martin Moeller, German Wool Institute/Technical University of Aachen, Germany
Session 4: Beyond Topography: Measurement of Physical Properties at the Nanoscale. Chair: Dawn Bonnell, University of Pennsylvania, USA. Guest Speaker: Kumar Wickramasinghe, IBM Almaden Research Center, San Jose, USA
Session 5: Instruments and Probes: New Tools and Techniques for Nanoscience. Chair: Chang Liu, University of Illinois, Urbana-Champaign, USA. Guest Speaker: Masamichi Fujihira, Tokyo Institute of Technology, Japan