Article - 4 Jan 2018
NT-MDT Spectrum Instruments launches a new approach for simultaneous study of topography and electromechanical properties of fragile and soft samples.
Article - 8 Sep 2017
Two dimensional (2D) materials are substances with a thickness measured in the nanometer (nm) scale.
Article - 28 Jun 2017
Saturable absorbers, which operate at terahertz (THz) frequencies, are beginning to open doors in the development of photonic devices, namely in passively mode-locked THz micro-sources.
Article - 26 Apr 2017
Electrochemistry refers to the interplay between chemical and electrical energy, where electrons drive chemical changes or chemical reactions to move electric charges.
Article - 27 May 2016
Atomic force microscopy (AFM) was first used in 1986 and uses a cantilever with a sharp tip to scan across a sample to produce a topographic map. The process is now expanding its use over a range of...
Article - 13 May 2016
Scanning microwave impedance microscopy, also known as sMIM, is an atomic force microscopy (AFM)-based method used for the characterization of materials and devices.
Article - 10 May 2016
Fluorescence lifetime imaging microscopy (FLIM) offers optically encoded data about live cells processes. In contrast, atomic force microscopy (AFM) provides mechanical and nanometer-resolved surface...
Article - 24 Sep 2015
Nanoscale materials, in the form of nanoparticles, are playing an important and growing role across a range of different applications and industries which seek to exploit the unique properties...
Article - 29 Apr 2015
The tunable microwave-frequency alternating current scanning tunneling microscope (ACSTM) has enabled the recording of local chemical data and local spectra on insulator surfaces.
Article - 3 Mar 2014
In this interview, Dr. Mark R. Munch, president of Bruker Nano Surfaces and Bruker MAT Group, talks to AZoNano about the strategy behind the recent acquisition of Prairie Technologies, and how their...