Nova Measuring Instruments Ltd. is a leading global semiconductor equipment
manufacturer with solutions and services that are used by 21 of the largest
25 IC manufacturers. Nova's expertise in Thin Film and Optical CD & shape
profiling metrology systems are addressing the complex measurement and process
control challenges of High Volume Production (HVM) in 300 & 200 mm IC manufacturing,
from 90nm to the demanding 45nm and 32nm technology nodes.
The company's systems utilize a combination of Spectroscopic Reflectrometry
and Scatterometry to measure CD, trench depth, photoresist height, thickness
and shape of complex layer stacks, as well as a variety of other features and
parameters guaranteeing the delivery of tight wafer-to-wafer and within-wafer
control. Nova offers Integrated Metrology (IM) and Stand-alone (SA) metrology
product lines addressing different metrology needs. These hardware products
are complemented by advanced structure modeling and application development
software empowering fab engineers with the automation and flexibility necessary
to develop in-fab 2D/3D and in-die applications for high-end semiconductor devices.
Leading Logic Manufacturer Selects Nova Optical CD Solution for 10nm, 7nm Technology Node Production
Major Foundry Acquires Nova’s Metrology Products for 2Xnm Ramp up of Production
Major Foundries Place Orders for Nova’s Metrology Products for 2X nm Production Ramp Up
Nova’s Metrology Solutions Chosen for 11 and 14 nm Technology Node Development
Nova T600 Accurately Controls Processes of Complex Vertical Structures for Beyond 22 nm Nodes
Nova i500 Metrology System Enabling High-Speed Wafer Processing Obtains Multiple Orders
NovaMARS Chosen as One of 15 Best Products of 2009 by Semiconductor International
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
This product profile from Merck outlines information about ultrastable fluorescent silica nanobeads.
The ClearView scintillator camera that elevates your everyday transmission electron microscopy (TEM).
Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.