Nanoscale science began in the IBM's Zurich Research Laboratory with the groundbreaking invention of the scanning tunneling microscope (STM), for which Gerd Binnig and Heinrich Rohrer were awarded the Nobel Prize for Physics in 1986.
Equally important was the development of the atomic force microscope (AFM) by Gerd Binnig, Christoph Gerber, and Calvin Quate in the mid-1980s. Work in this research area encompasses novel applications of scanning probe methods and related techniques with which one can manipulate individual atoms and molecules to construct nanometer-sized structures. Scientists' goal is to construct functional devices such as transistors out of nature's fundamental building blocks. Increasing efforts have been dedicated to the development of sensors for chemical and biological interactions, stress, magnetization, etc. in extremely minute amounts of materials as well as into the development of such SPM techniques as microscopy based on chemical interactions, nuclear magnetic resonance or dynamic forces. Research work also includes imaging of nanoscopic magnetic structures with the aim to improve our understanding of ferromagnetism at its limits.
Development of Novel Tip Aids in Nanolithography and Nanomanufacturing Applications
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Dr. Laurene Tetard
AZoNano speaks with Dr. Laurene Tetard from the University of Central Florida about her upcoming research into the development of nanotechnology that can detect animal-borne diseases. The hope is that such technology can be used to help rapidly control infected mosquito populations to protect public
Dr. Amir Sheikhi
AZoNano speaks with Dr. Amir Sheikhi from Pennsylvania State University about his research into creating a new group of nanomaterials designed to capture chemotherapy drugs before they impact healthy tissue, amending a fault traditionally associated with conventional nanoparticles.
The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.
This product profile describes the latest nano-particle analyzer "thesis particle size analyzer" and its key
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.