Atomic Force Microscopes (AFMs) are versatile instruments that interact with surfaces at the nanometer scale. By "feeling" a sample using a very sharp needle, not unlike the way a record player works, a very precise 3D reconstruction of the surface can be created.
AFMs have been around since the 1980s and have become indispensable tools for scientists and engineers. ICSPI has improved these conventional instruments by dramatically reducing their size, cost, and complexity. We integrated all of the active components of an AFM onto a silicon microchip. The sharp needle can be positioned with three degrees of freedom by a tiny moving machine, or MEMS device, with built-in sensors. The MEMS device is made in the same reliable CMOS process as virtually all computer chips.
The Single-Chip Atomic Force Microscope
Prof. Hongxia Wang
We speak with Professor Hongxia Wang from QUT about a new project that hopes to utilize graphene and other low-cost carbon materials to produce commercially viable, ultra low-cost, flexible perovskite solar cells.
Moti Segev & Vlad Shalaev
In this interview, AzoNano speaks to Professor Moti Segev and Professor Vladimir Shalaev, who made surprising discoveries about photonic time crystals that challenge existing research and theories.
Siyu Chen, Ph.D.
In this interview, we discuss a new approach to surface-enhanced Raman spectroscopy that utilizes nano-pockets to capture target molecules, ensuring a highly sensitive way to detect chemical processes.
This product profile from Merck outlines information about ultrastable fluorescent silica nanobeads.
The ClearView scintillator camera that elevates your everyday transmission electron microscopy (TEM).
Achieve high-throughput co-localized imaging and in-situ nanoindentation with Bruker’s Hysitron PI 89 Auto SEM.