Kelvin probe force microscopy (KPFM) maps electrostatic potential at sample surfaces to provide information about electronic structure, doping level variations, trapped charges, and chemical identity in applications ranging from organic photovoltaics research to silicon and wide bandgap semiconductor characterization.
Bruker’s PeakForce KPFM™ module for the Dimension Icon® and MultiMode® 8 AFMs combines the complete set of KPFM detection mechanisms, including amplitude and frequency modulation, with both TappingMode™ and PeakForce Tapping™ to provide directly correlated quantitative nanomechanical data. The result is improved sensitivity of the frequency-modulation measurements and immunity to artifacts from mechanical crosstalk.
In addition, PeakForce KPFM provides a completely automated parameter setup with ScanAsyst®. The result is a significant improvement in quantitative surface potential data for materials research as well as semiconductor applications.
The Complete KPFM Solution
- Most accurate, repeatable, and sensitive work function measurements
- Leading-edge spatial resolution combined with artifact-free potential contrast
- PeakForce QNM® correlated quantitative nanomechanical property mapping
- ScanAsyst® ease of use and optimized results