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Hitachi GST’s Ultrastar SSD400S.B Family Uses 25 nm SLC NAND Flash

Hitachi Global Storage Technologies (Hitachi GST) has declared that its Ultrastar enterprise-class solid state drive (SSD) portfolio has become the first in the industry to use 25 nm single-level cell (SLC) NAND flash.

9 Feb 2012

V-Smart Nanovesicle Platform Developer Receives Research Grant

Biotechnology firm, Lauren Sciences has declared that The Michael J. Fox Foundation for Parkinson's Research has awarded a grant to the company to further develop its innovative V-Smart nanovesicle platform technology for target-specific delivery of glial-derived naturetic factor (GDNF) systemically to the brain across the blood brain barrier for treating Parkinson's disease.

9 Feb 2012

HF CVD System Provider Expands Research and Production Capabilities

sp3 Diamond Technologies, a provider of diamond deposition equipment, products and services, has witnessed a three-fold increase in the delivery of its hot filament chemical vapor deposition (HF CVD) reactors and a revenue growth of 73% in 2011when compared to 2009.

From sp3 9 Feb 2012

Epistar to Use Veeco’s MOCVD Tool for GaN-on-Si LED Development

Veeco Instruments, a manufacturer of process equipment for developing and producing hard disk drives, solar cells, LEDs and other devices, has announced the selection of its gallium nitride (GaN) Metal Organic Chemical Vapor Deposition (MOCVD) System called TurboDisc K465i by Epistar for growing light emitting diodes (LEDs) on silicon substrates.

From Veeco 8 Feb 2012

Japanese Small and Medium Enterprises to Display Products at nano tech 2012

In nano tech 2012, the 11th International Nanotechnology Exhibition and Conference, thirteen Japanese small and medium enterprises will participate in ‘nano tech Grow Up,’ the oversea marketing support space arranged by the Organization for Small & Medium Enterprises and Regional Innovation, Japan (SME Support, Japan).

8 Feb 2012

Rudolph’s Metrology System Offers Non-Destructive Measurements on Product Wafers

Rudolph Technologies has entered into a new market for metrology by delivering its first MetaPULSE metrology system for measuring redistribution layers (RDL) and under bump metallization (UBM) utilized in sophisticated back-end packaging technologies of the integrated circuit (IC) production process.

From Onto Innovation 8 Feb 2012

LG Siltron to Use Veeco’s MOCVD System for Producing GaN-on-Si Wafers

LG Siltron, an epi wafer manufacturer based in South Korea, has chosen Veeco Instruments’ gallium nitride metal organic chemical vapor deposition (MOCVD) system called TurboDisc K465i for manufacturing gallium nitride on silicon (GaN-on-Si) wafers for use in LED devices and power electronics.

From Veeco 8 Feb 2012