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CHAD Industries, Veeco to Showcase Automated Wafer Inspection Solutions

CHAD Industries, Veeco to Showcase Automated Wafer Inspection Solutions

Altairnano Unveils New Application Kit Targeting Original Equipment Manufacturers

Altairnano Unveils New Application Kit Targeting Original Equipment Manufacturers

Computer Scientists Secure NSF Grant for Developing Nano-Scale Technologies

Leading Scientists to Discuss Advances in Computing

New Chip Manufacturing Technology to be Announced by Applied Materials

New Chip Manufacturing Technology to be Announced by Applied Materials

16 IMEC Authors Accepted for IEEE International Electron Devices Meeting

Asian Integrated Device Maker Orders Camtek’s Wafer Inspection Systems

New Microelectronics Advertising Campaign for QA Professionals

Imec Researchers Examine Gate Oxide Trapping

Imec Researchers Examine Gate Oxide Trapping

Imec Establishes Metrology Method for Optimizing Etch Rate Uniformity in Transformer Coupled Plasma Reactor

Imec Establishes Metrology Method for Optimizing Etch Rate Uniformity in Transformer Coupled Plasma Reactor

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