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Industry's First 30-nm-Class DRAM Completes Customer Evaluations

Samsung Electronics Co., Ltd., the world leader in advanced semiconductor technology solutions, today announced that the industry's first 30-nanometer-class DRAM has just successfully completed customer evaluations, in two gigabit (Gb) densities.

1 Feb 2010

CRAIC Technologies Introduces QDI 302 Microscope Spectrophotometer for OLED Research

Organic Light Emitting Diodes (OLED) are being developed for the next generation of displays and light sources. The QDI 302 microscope spectrophotometer, from CRAIC Technologies, is designed to measure and compare the spectral output, intensity and color consistency of each of the microscopic pixels commonly found in OLED devices.

31 Jan 2010

Princess Anne Opens UCL Molecular Beam Epitaxy Facility

The Molecular Beam Epitaxy (MBE) Facility of the Department of Electronic and Electrical Engineering and the London Centre for Nanotechnology was opened by HRH The Princess Royal.

29 Jan 2010

New EU-Funded Project Set to Simplify Life for Europe's Semiconductor and Electronics Industries

A new EU-funded project is set to simplify life for Europe's semiconductor and electronics industries by making it easier to detect and correct errors. Called DIAMOND ('Diagnosis, error modelling and correction for reliable systems design'), the EUR 3.8 million, 3-year project is funded under the Information and communication technologies (ICT) Theme of the Seventh Framework Programme (FP7).

28 Jan 2010

Acquisition Strengthens Semiconductor Test Solutions Aimed at Emerging Markets

The test systems business specializes in wafer-level test solutions for devices under test (DUT), and strengthens Cascade Microtech's position as a worldwide leader in the design, development and manufacture of advanced wafer probing solutions for the electrical measurement and test of semiconductor integrated circuits and chips.

28 Jan 2010

The Search for Solutions to Industry's Most Challenging Issues at 2010 SEMATECH Knowledge Series

Semiconductor technologists from a wide range of fields can join the search for solutions to the industry's most challenging issues at the 2010 SEMATECH Knowledge Series (SKS) of meetings, workshops and symposia. ...

27 Jan 2010

New Approach in the Design of Miniature Insectlike Microids

Advanced computer simulations indicate these synthetic bugs would have significantly better dexterity than previous microscale robots. The robots also might be able to "scavenge vibrational energy" from the environment to recharge their power supply, said Jason Clark, an assistant professor of electrical, computer and mechanical engineering at Purdue University.

27 Jan 2010

Nanoelectronics News

Industry's First 30-nm-Class DRAM Completes Customer Evaluations

CRAIC Technologies Introduces QDI 302 Microscope Spectrophotometer for OLED Research

Princess Anne Opens UCL Molecular Beam Epitaxy Facility

New EU-Funded Project Set to Simplify Life for Europe's Semiconductor and Electronics Industries

Acquisition Strengthens Semiconductor Test Solutions Aimed at Emerging Markets

The Search for Solutions to Industry's Most Challenging Issues at 2010 SEMATECH Knowledge Series

New Approach in the Design of Miniature Insectlike Microids

Bizarre Substance Predicted to Shrink Electronics

Power-Generating Rubber Films Harnessing Natural Body Movements to Power Electronic Devices

Validated Flow for Rapid Reduction in Variation Risk in Nanometer Designs at Transistor Level

Novel 3D Imaging Technique Captures In Situ Nanoparticle Self-Assembly

Nanoparticles That Boost Tomato Plant Growth

Research Boosts Graphene’s Potential to Unprecedented Heights

New Study Finds Electrons Flow Like Liquid in Graphene, Breaking Rules

Orange Peel Nanoparticles: New Green Synthesis

Enhancing Slurry Stability in Lithium-Ion Batteries with Turbiscan Technology

PiFM and its Role in Nanoscale Chemical Imaging

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Sponsored Content

Comparing Spectroscopic Techniques for Nanoscale Analysis of Polyethylene Formation

How Photothermal AFM-IR Enables Nanoscale Defect Detection in Semiconductors

Overcoming the Limits of Traditional DLS in Lipid-Based Nanoparticle Manufacturing

Next-Generation Biological Imaging Using Raman-SEM