Posted in | Nanobusiness

Nanometrics to Deliver Presentation at Conference in New York

Nanometrics, a provider of sophisticated process control solutions and systems has declared that its CEO and president, Dr Timothy Stultz will deliver an address at the 14th Annual Needham Growth Conference.

The conference will be held in New York from January 10 to 12, 2012. The presentation from Nanometrics will be on January 12 . The Nanometrics’ website’s investor page will have a live audio webcast as well as an archived recording of the presentation.

Nanometrics supplies sophisticated, superior-performance process control inspection and metrology systems mainly used to fabricate high-brightness LEDs, semiconductors, solar photovoltaics and data storage devices. The systems provided by Nanometrics enable critical dimension control, overlay registration, topography, thin film characteristics that include film thickness and material, electrical and optical properties.

The process control solutions are used during the entire fabrication process from substrate manufacturing at front-end-of-line to bulk manufacture of semiconductors to sophisticated wafer-scale packaging. The systems from Nanometrics help in enhancing yields, improving productivity, and reducing manufacturing expenses.


Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback