Posted in | Nanoanalysis

New Guide to Select the Right Nano Measurement Technology for Dimensional Inspection and Reverse Engineering

Q-PLUS Labs, Inc., a leading full-service precision dimensional measurement and inspection laboratory, and distributor of dimensional metrology equipment, systems, and accessories, announced today it is releasing a new guide to help businesses select the right nano measurement technology for dimensional inspection and reverse engineering needs.

The e-book Selecting the Right Nano Measurement Technology for Dimensional Inspection and Reverse Engineering is available for free download at http://info2.qpluslabs.com/nano-measurement-0.

Manufacturers, business owners, and governments are increasingly turning to measurement at the nano scale to measure products requiring micro manufacturing such as silicon photonic devices, orthodontic brackets, tapered variable helical root canal files, stents, or jeweled bearings. When it comes to the products and industries requiring measurement at the nano scale, there are a variety of factors that must be considered carefully to get the most accurate measurement.

This e-book outlines the various technologies that are currently used for nano measurement, some of the challenges of measuring objects at such a small scale, and useful tips to help you select the right nano measurement equipment for your application.

"To enhance the ability to measure small objects with exceptionally high accuracy regardless of reflectivity or translucence, it is critical to select the right equipment," said Michael D. Knicker, president of Q-PLUS Labs, Inc. "After what amounts to over a year of ongoing research and projects, we’ve been able to find the methods and systems that work best for 3D nano-scanning and surface profilometry. If you read this e-book and think you’ll need measurement at the nano scale, we’ll walk you through the entire process and help you make an informed decision."

Source: http://www.qpluslabs.com/

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