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Characterization of Novel Data Storage Solutions

Explore the characterization of novel date solutions with AFM and EDS.

From Asylum Research - An Oxford Instruments Company 27 Feb 2023

Force Scanning with Atomic Force Microscopy (AFM)

Atomic force microscopy (AFM) is able to reveal many properties about a material.

From Asylum Research - An Oxford Instruments Company 27 Feb 2023

Using Atomic Force Microscopy for Nanotribology

Learn more about using atomic force microscopy for nanotribology.

From Asylum Research - An Oxford Instruments Company 27 Feb 2023

Atomic Force Microscopy Characterization of Thin Films

Learn more about atomic force microscopy characterization on thin films.

From Asylum Research - An Oxford Instruments Company 27 Feb 2023

Why Nanotechnology Underpins Electrochemical Sensing Innovation

Nanotechnology is now underpinning many of the new developments in electrochemical sensors. This includes nanofabrication methods for creating microfluidics, electrodes and sensing materials.

From Pittcon 24 Feb 2023

How do results from different dynamic light scattering instruments compare?

Dynamic Light Scattering is commonly used to rapidly measure the hydrodynamic size and size dispersity of nanoparticles in suspension. Several commercial DLS instruments exist, using a range of illumination wavelengths and detection angles.

From InProcess-LSP 22 Feb 2023

CVD Graphene: Focus on Real-World Applications

This article describes the developmental journey of graphene from hype to productivity.

From General Graphene Corporation 15 Feb 2023

Environmental Monitoring Handbook for the Pharmaceutical Industry

This handbook from Particle Measuring Systems focuses on environmental monitoring in the pharmaceutical industry and covers the basics of particle counting and cleanrooms, as well as the necessary instrumentation and techniques in order to comply with regulatory standards.

From Particle Measuring Systems 14 Feb 2023