Electricity itself was still a novelty when Cornell University introduced the nation's (and the world's) first course of study in electrical engineering in 1883.
Now, the reach of electrical and computer engineering extends from the nanoscale level of integrated electronics to terrestrial-scale power grids; from single-transistor devices to networks comprising a billion nodes.
With 40 faculty members, 300 graduate students, and more than 500 undergraduates, the School of Electrical and Computer Engineering (ECE) is the largest school in Cornell University's College of Engineering, and consistently ranks among the top ECE schools nationally.
Our programs encompass digital and computer systems, embedded processors, digital signal processing, R. F. (wireless) systems, optical communications, atmospheric and space plasmas, solid-state electronics, integrated circuit design and fabrication, and biomedical applications such as image processing, sensors, and signal analysis.
ECE remains at the forefront of these fields, educating and training the next generation of engineers while driving the leading edge of technology.
Nanotech Grant For Cornell Researcher - News Item
Jingang Li, Ph.D.
In this interview, AZoNano discusses the development of a novel solid-state optical nanomotor, which is driven by light.
Professor Jacek Jasienak
In this interview, we discuss a nanoparticle ink used to produce low-cost printable perovskite solar cells, helping to catalyze the technology transition toward commercial viable perovskite-based devices.
Ping Wang, Ph.D.
We speak with researchers behind the latest advancement in graphene hBN research that could boost the development of next-generation electronic and quantum devices.
Inoveno’s PE-550 is a best-selling electrospinning/spraying machine that can be used for the continuous production of nanofibers.
The Filmetrics R54 advanced sheet resistance mapping tool for semiconductor and compound semiconductor wafers.
The Filmetrics F40 turns your benchtop microscope into an instrument for measuring thickness and refractive index.