The LEAP
4000X HR™ is a high performance 3D atom probe microscope which provides
nano-scale surface, bulk and interfacial materials analysis of simple and complex
structures with atom by atom identification and accurate spatial positioning.
The system works using the principle of field evaporation, whereby a strong
electric field applied to the specimen is sufficient to cause removal of atoms
by ionization. Atom removal is triggered either via a voltage or laser pulse
applied to the sample.
The LEAP
HR provides the following key features:
- Excellent field of view with good mass resolution
- Local electrode and microtip compatibility
Local Electrode and Microtips
"LEAP" is derived from Local Electrode™ Atom Probe.
The Local Electrode™ provides a strong technological advantage over systems
which do not have one, improving both ease of use and data quality. The Local
Electrode also enables the use of prefabricated Microtip™ arrays. Using
these enables multiple analytical specimens to be prepared, mounted and loaded
into the instrument for maximum efficiency with multi experiment scenarios.
Reflectron
The LEAP
4000X HR utilizes a novel energy compensated design that combines optimized
mass resolution performance for detailed mass spectral interpretation, with
wide Field-of-view (250 nm achievable). For voltage pulsing applications (traditionally
metals), the performance is excellent and the system provides very high atom
probe mass resolution.
Small spot UV laser
The system uses a UV laser with a tightly focused spot. The small
UV laser spot enables exceptional mass resolution to be obtained. The use of
UV wavelength enables a wide variety of materials, including many insulators,
to be analyzed with good yield. High specimen throughput is obtained by achieving
fast pulse repetition rates. For laser pulsing applications, the LEAP
4000X HR also provides excellent mass resolving power at full Field from
the tightly focused UV laser spot and long ion flight times.