The London Centre for Nanotechnology (LCN) and Veeco Instruments, UK are joining forces to set-up a training course for professionals and academics dedicated to the utilisation of Atomic Force Microscopes (AFM).
Scientists at The University of Nottingham have overcome one of the significant research challenges facing electrochemists. For the first time they have found a way of probing right into the heart of an electrochemical r...
The National Science Foundation has awarded $431,200 to the University of Alabama at Birmingham (UAB) Department of Physics to facilitate the purchase of a new highly-specialized imaging system - the first of its kind in Alabama - that will be a centerpiece of a new interdisciplinary research laboratory on campus.
Cascade Microtech, Inc. (NASDAQ: CSCD) today announced King Abdullah University of Science and Technology's selection of multiple probe stations to support measurements in the area of materials analysis, nano-technol...
Jordan Valley Semiconductors Ltd., the market leader in X-ray metrology tools is pleased to announce the delivery of its JVX6200 XRR (X-Ray Reflectometry) metrology tool to a leading-edge HDD (Hard Disk Drive) vendor, us...
DEK has launched its brand new Paste Roll Height Monitor, an easy-to-use productivity tool designed to eliminate defects and improve end-of-line yield. Using lasers to detect the presence of solder paste, the new technol...
The National Institute of Standards and Technology (NIST) has issued a new ruler, and even for an organization that routinely deals in superlatives, it sets some records. Designed to be the most accurate commercially ava...
Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the S...
Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology, today announced the release of its NPFLEX™ 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation.
Scientists at the U.S. Department of Energy's (DOE) Brookhaven National Laboratory, in collaboration with researchers from Hitachi High Technologies Corp., have demonstrated a new scanning electron microscope capable of selectively imaging single atoms on the top surface of a specimen while a second, simultaneous imaging signal shows atoms throughout the sample's depth.
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