Leading analytical X-ray company
(Almelo, the Netherlands) will reinforce its reputation for complete solutions
at this year’s ACHEMA conference and exhibition (11 - 15 May 2009; Frankfurt
am Main, Germany).
Visitors to hall 6.3, booth J21-K23, will experience innovative 3-D interactive
product simulations showcasing the Axios range of XRF spectrometers. Omnian,
PANalytical’s new standardless XRF analysis package for the rapid quantification
of unknown samples, makes its European exhibition debut, and the company will
also feature one of its flexible, cost-effective application-specific MiniPal
systems. The instrumentation, software and standards packages will demonstrate
complete solutions for elemental analysis in the cement, mining, metals, pharmaceutical,
chemical, plastics and oil industries.
A wide range of PANalytical XRD hardware and software will also be on show.
With applications as diverse as pharmaceuticals and nanomaterials, the X’Pert
PRO multi-purpose X-ray diffractometer will be featured. Visitors can test PANalytical’s
unique PreFIX system for the rapid exchange of all optical components without
the need for realignment. The X’Pert PRO system allows an unmatched range
of geometries, from the traditional Bragg-Brentano to an ultra-fast transmission
high-throughput system with the revolutionary PIXcel detector. It can also accommodate
a SAXS setup. Flexible XRD software covers phase analysis, stress and thin film
analysis, high-end cluster analysis and small-angle scattering, for example.
PANalytical experts will be on hand to demonstrate the company’s analytical
X-ray solutions, and discuss your specific application challenges.