Bruker, a developer of high-performance scientific instruments for molecular and materials research and analysis, introduces the tenth generation of Dektak stylus profiler, DektakXT.
The new profiler operates with constant gage repeatability of less than five angstroms, which represents the major milestone in surface metrology performance.
Bruker DektakXT 10th Generation Stylus Profiler
Dektak precision metrology instrument has a wide range of applications such as display, LED, microelectronics, medical, semiconductor, and materials science sectors. This instrument is found installed in several facilities globally. Dektak stylus profilers are used in three-dimensional surface profiling and two-dimensional profilometry. Dektak has become a significant brand in the material sciences industry.
DektakXT profiler has been developed by adding new capabilities to the Dektak system, which include single-arch design with advanced metrology elements, high-definition resolution camera, and first parallel processing, 64-bit software architecture. With these features, Dektak’s tenth generation systems will be able to measure nanoscale film thickness, as well as surface texture with enhanced repeatability and performance will be up to 40% faster. The revolutionary stylus profiler offers best results for various metrology applications that require low ownership cost, better processing speed, and repeatable nanometer-scale measurements.
Ross Q. Smith, VP and General Manager of Stylus and Optical Metrology Business at Bruker, states that DektakXT has been developed by combining the best characteristics of nine preceding generations of the stylus profiler with significant enhancements. The improved features will enable next generation of innovations in the nanoscale material science.
Source: http://www.bruker.com/