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Nanotechnology Measurement Methods Explained in Online Paper

Cleveland-based Keithley Instruments, a developer of advanced electrical test equipment and platforms, has recently released a poster that provides details on nanotechnology measurement guidelines and methodologies.

A free issue of the poster, called, ‘Measurement Techniques for Characterizing Graphene, Carbon Nanotubes, and Nano-materials and Devices: Low Power, Low Voltage, Low Resistance,’ can be had on request from the company.

The poster has been segregated into various categories such as Measurement Technique for Hall Voltage and Resistivity Measurements, Technique for Measuring Resistance as a Function of Gate Voltage, Circuit to Measure Drain Family of Curves on a Carbon Nanotube and Avoiding Sources of Error When Measuring Low Power Materials and Devices.

Keithley collaborates with organizations such as the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, client companies, and other nanotechnology measurement equipment retailers to develop complicated nano test platforms.



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