Jan 21 2009
RHK announces the release of XPMPro™ 2.0 software. XPMPro provides real-time data acquisition, analysis, and image processing for SPM nanotechnology research. Everyday, in university and government labs around the globe, RHK AFM/STM systems lead to new discoveries in nanotechnology. XPMPro™ is the cornerstone of these systems. The new release allows researchers to manipulate atoms with more control, automatically track individual atoms moving across a surface, compensate for thermal drift in 3 dimensions, and expands advanced spectroscopy techniques.
Adam Kollin, President of RHK states, "We've added new capabilities and advanced solutions to overcome the challenges researchers face as they push the limits of today's technology. The release of 2.0 ensures that scientists can continue to expand the frontiers of nano-scale research." Users can visit www.rhk-tech.com to download XPMPro™ 2.0 control software.